Log in
Sign up
Golden has been acquired by ComplyAdvantage.Read about it here ⟶
‌

Bernard E Souw

OverviewStructured DataIssuesContributorsActivity

All edits

Edits on 14 Dec, 2021
"Remove inverse infobox"
Golden AI profile picture
Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-336 properties)
Infobox
Patent primary examiner of
‌
US Patent 7391038 Technique for isocentric ion beam scanning
‌
US Patent 7397049 Determining ion beam parallelism using refraction method
‌
US Patent 7405402 Method and apparatus for aberration-insensitive electron beam imaging
‌
US Patent 7420106 Scanning probe characterization of surfaces
‌
US Patent 7420161 Branched radio frequency multipole
‌
US Patent 7420181 Liquid metal ion gun
‌
US Patent 7423264 Atomic force microscope
‌
US Patent 7423266 Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus
‌
US Patent 7423268 Projection imaging type electron microscope
‌
US Patent 7423269 Automated feature analysis with off-axis tilting
‌
US Patent 7425713 Synchronous raster scanning lithographic system
‌
US Patent 7435972 Focused ion beam apparatus and liquid metal ion source
‌
US Patent 7453059 Technique for monitoring and controlling a plasma process
‌
US Patent 7456417 Laser plasma EUV light source, target material, tape material, a method of producing target material, a method of providing targets, and an EUV exposure device
‌
US Patent 7468511 FAIMS electrodes with lateral ion focusing
‌
US Patent 7470901 Charged particle spectrometer and detector therefor
‌
US Patent 7470906 Adaptive collimator for nuclear medicine and imaging
‌
US Patent 7470919 Substrate support assembly with thermal isolating plate
‌
US Patent 7473912 Method and apparatus for patterning micro and nano structures using a mask-less process
‌
US Patent 7473914 System and method for producing terahertz radiation
‌
US Patent 7476787 Addressable field enhancement microscopy
‌
US Patent 7476849 Technique for monitoring and controlling a plasma process
‌
US Patent 7476850 Method and its apparatus for mass spectrometry
‌
US Patent 7476851 Aerodynamic focusing of nanoparticle or cluster beams
‌
US Patent 7476852 Ionization-based detection
‌
US Patent 7476855 Beam tuning with automatic magnet pole rotation for ion implanters
‌
US Patent 7476856 Sample dimension-measuring method and charged particle beam apparatus
‌
US Patent 7476868 Apparatus and method for generating ions of an ion implanter
‌
US Patent 7476871 Specimen box for electron microscope capable of observing general specimen and live cell
‌
US Patent 7476876 Ion beam angle measurement systems and methods employing varied angle slot arrays for ion implantation systems
‌
US Patent 7476879 Placement effects correction in raster pattern generator
‌
US Patent 7476882 Calibration method for electron-beam system and electron-beam system
‌
US Patent 7476883 Biomarker generator system
‌
US Patent 7476885 Disinfecting device utilizing ultraviolet radiation
‌
US Patent 7476887 EUV light source optical elements
‌
US Patent 7477456 Zoom lens
‌
US Patent 7479634 Electron beam apparatus and device manufacturing method using the same
‌
US Patent 7482610 Vertical-cavity enhanced resonant thermal emitter
‌
US Patent 7485881 Lithographic apparatus, illumination system, filter system and method for cooling a support of such a filter system
‌
US Patent 7486773 Megavoltage scatter radiation measurement using beam stop array
‌
US Patent 7488938 Charge-control method and apparatus for electron beam imaging
‌
US Patent 7495239 Method for cleaning a lithographic apparatus module, a cleaning arrangement and a lithographic apparatus comprising the cleaning arrangement
‌
US Patent 7498572 Deflecting electromagnet and ion beam irradiating apparatus
‌
US Patent 7498591 Critical dimension effects correction in raster pattern generator
‌
US Patent 7504625 Substrate inspection method, manufacturing method of semiconductor device and substrate inspection apparatus
‌
US Patent 7504643 Method for cleaning a lithographic apparatus module, a cleaning arrangement and a lithographic apparatus comprising the cleaning arrangement
‌
US Patent 7504644 Method and devices for producing corpuscular radiation systems
‌
US Patent 7507953 Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
‌
US Patent 7507961 Method and apparatus of pattern inspection and semiconductor inspection system using the same
‌
US Patent 7507978 Beam line architecture for ion implanter
‌
US Patent 7511267 Data-dependent accurate mass neutral loss analysis
‌
US Patent 7514679 Scanning probe microscope for measuring angle and method of measuring a sample using the same
‌
US Patent 7514681 Electrical process monitoring using mirror-mode electron microscopy
‌
US Patent 7514682 Electron anti-fogging baffle used as a detector
‌
US Patent 7518105 Continuous sampling ion mobility spectrometers and methods therefor
‌
US Patent 7518106 Ion mobility spectrometers and methods for ion mobility spectrometry
‌
US Patent 7518123 Heat capacitor for capillary aerosol generator
‌
US Patent 7525104 Particle beam irradiation method and particle beam irradiation apparatus used for the same
‌
US Patent 7528367 Ion mobility spectrometer
‌
US Patent 7528390 Broad beam ion implantation architecture
‌
US Patent 7528397 Thermal infrared signage method with application to infrared weapon sight calibration
‌
US Patent 7538321 Method of identifying substances using mass spectrometry
‌
US Patent 7538322 Method of fabricating sample membranes for transmission electron microscopy analysis
‌
US Patent 7541597 Automatic cleaning of ion sources
‌
US Patent 7541604 Arrangement for the generation of short-wavelength radiation based on a gas discharge plasma and method for the production of coolant-carrying electrode housings
‌
US Patent 7544254 System and method for cleaning an ion implanter
‌
US Patent 7544936 Method and device for observing a specimen in a field of view of an electron microscope
‌
US Patent 7547893 Infant stimulation and environment sterilizing device
‌
US Patent 7550748 Apparatus and methods for systematic non-uniformity correction using a gas cluster ion beam
‌
US Patent 7550749 Methods and processing systems for using a gas cluster ion beam to offset systematic non-uniformities in workpieces processed in a process tool
‌
US Patent 7554094 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
‌
US Patent 7557347 Charged particle beam apparatus, scanning electron microscope, and sample observation method using the same
‌
US Patent 7557364 Charge neutralizing device
‌
US Patent 7559557 Sealing between vacuum chambers
‌
US Patent 7560716 Free electron oscillator
‌
US Patent 7569811 Concentrating mass spectrometer ion guide, spectrometer and method
‌
US Patent 7569817 Scanning probe apparatus
‌
US Patent 7569840 Alignment method of a laser beam processing machine
‌
US Patent 7569842 Method for correcting electron beam exposure data
‌
US Patent 7576319 Systems for differential ion mobility analysis
‌
US Patent 7576322 Non-contact detector system with plasma ion source
‌
US Patent 7576323 Point-of-care mass spectrometer system
‌
US Patent 7579590 Method of measuring thin layers using SIMS
‌
US Patent 7582864 Linear ion trap with an imbalanced radio frequency field
‌
US Patent 7586089 Feedback fragmentation in ion trap mass spectrometers
‌
US Patent 7586110 Techniques for detecting ion beam contamination in an ion implantation system and interlocking same
‌
US Patent 7589332 Via-hole processing method
‌
US Patent 7589333 Methods for rapidly switching off an ion beam
‌
US Patent 7592612 Method and apparatus for surface potential reflection electron mask lithography
‌
US Patent 7595482 Standard component for length measurement, method for producing the same, and electron beam metrology system using the same
‌
US Patent 7595487 Confining/focusing vortex flow transmission structure, mass spectrometry systems, and methods of transmitting particles, droplets, and ions
‌
US Patent 7595488 Method and apparatus for specifying working position on a sample and method of working the sample
‌
US Patent 7595489 Method and apparatus for material identification
‌
US Patent 7598489 Systems and methods for ion mobility control
‌
US Patent 7598503 Lithographic apparatus and cleaning method therefor
‌
US Patent 7601960 Control for UV water disinfection
‌
US Patent 7605367 Explosives detection using differential mobility spectrometry
‌
US Patent 7605368 Vibration-type cantilever holder and scanning probe microscope
‌
US Patent 7605377 On-chip reflectron and ion optics
‌
US Patent 7605387 Radiation shield
‌
US Patent 7608847 System and method for implementing a suspended personal radiation protection system
‌
US Patent 7615765 Charged particle beam apparatus
‌
US Patent 7619230 Charged particle beam writing method and apparatus and readable storage medium
‌
US Patent 7622709 Variable-ratio neutron-gamma ray source
‌
US Patent 7622726 Dual neutron-gamma ray source
‌
US Patent 7626162 Mass spectrometry system and mass spectrometry method
‌
US Patent 7626166 Electron microscope
‌
US Patent 7626183 Methods for modifying features of a workpiece using a gas cluster ion beam
‌
US Patent 7629590 Method and apparatus for extending equipment uptime in ion implantation
‌
US Patent 7633062 Radiation portal monitor system and method
‌
US Patent 7633074 Arrangement and method for compensating emitter tip vibrations
‌
US Patent 7635839 Method for fabricating neutron supermirror using neutron monochromator structures
‌
US Patent 7638762 Systems and methods for decreasing settling times in MS/MS
‌
US Patent 7638778 Ultraviolet ray sterilization device
‌
US Patent 7642521 Laser irradiated hollow cylinder serving as a lens for ion beams
‌
US Patent 7642522 Device for irradiating liquids with UV radiation in a throughflow
‌
US Patent 7642528 Portable electronic device having appearance customizable housing
‌
US Patent 7645989 Electron microscope for inspecting and processing of an object with miniaturized structures and method thereof
‌
US Patent 7645994 Device for outputting high and/or low energy X-rays
‌
US Patent 7645996 Microscale gas discharge ion detector
‌
US Patent 7645999 Method and apparatus for creating a plasma
‌
US Patent 7649183 Apparatus for monitoring an item for radioactive material on or associated with the item
‌
US Patent 7652269 Laser atom probe methods
‌
US Patent 7653176 Inspection system with material identification
‌
US Patent 7655906 Method and apparatus for scanning and measurement by electron beam
‌
US Patent 7655923 Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
‌
US Patent 7655925 Gas management system for a laser-produced-plasma EUV light source
‌
US Patent 7655928 Ion acceleration column connection mechanism with integrated shielding electrode and related methods
‌
US Patent 7655931 Techniques for improving the performance and extending the lifetime of an ion source with gas mixing
‌
US Patent 7659509 System for scanning probe microscope input device
‌
US Patent 7659521 System for taking wide-field beam-eye-view (BEV) x-ray-images simultaneously to the proton therapy delivery
‌
US Patent 7659522 Method of purifying the used O-18 enriched cyclotron target water and apparatus for the same
‌
US Patent 7663104 Specimen inspection equipment and how to make electron beam absorbed current images
‌
US Patent 7663125 Ion beam current uniformity monitor, ion implanter and related method
‌
US Patent 7667215 Method and apparatus for providing radiation shielding for non-invasive inspection systems
‌
US Patent 7671343 Method of mass analysis and mass spectrometer
‌
US Patent 7672732 Portable apparatus that delivers power and information to implantable devices
‌
US Patent 7679055 Pattern displacement measuring method and pattern measuring device
‌
US Patent 7683342 Plasma source
‌
US Patent 7683355 Extreme ultra violet light source apparatus
‌
US Patent 7687783 Multi-beam deflector array device for maskless particle-beam processing
‌
US Patent 7692172 System and method for germicidal sanitizing of an elevator or other enclosed structure
‌
US Patent 7696487 Circuit pattern inspection apparatus
‌
US Patent 7705335 Security protection device and method
‌
US Patent 7709790 Removable ion source that does not require venting of the vacuum chamber
‌
US Patent 7714279 Orthogonal time-of-flight mass spectrometers with low mass discrimination
‌
US Patent 7714288 Charged particle beam apparatus
‌
US Patent 7714289 Charged particle beam apparatus
‌
US Patent 7714304 Computed tomography measuring arrangement and method
‌
US Patent 7714308 Variable shaped electron beam lithography system and method for manufacturing substrate
‌
US Patent 7714309 Phantom for ion range detection
‌
US Patent 7718960 Ion mobility spectrometer and ion-mobility-spectrometry/mass-spectrometry hybrid spectrometer
‌
US Patent 7718979 Particle-optical apparatus for simultaneous observing a sample with particles and photons
‌
US Patent 7718984 Optimized nuclear radiation shielding within composite structures for combined man made and natural radiation environments
‌
US Patent 7723675 Well type neutron counter containing an annular He-3 detector tube
‌
US Patent 7723700 Controlling the flow of vapors sublimated from solids
‌
US Patent 7728308 Apparatus for blanking a charged particle beam
‌
US Patent 7737397 Devices and systems including a boost device
‌
US Patent 7737416 Sample transfer unit and sample transferring method
‌
US Patent 7737420 Pixelated modulation of illumination pupil image
‌
US Patent 7741601 Testing apparatus using charged particles and device manufacturing method using the testing apparatus
‌
US Patent 7741622 Exposure device
‌
US Patent 7741624 Single session interactive ultra-short duration super-high biological dose rate radiation therapy and radiosurgery
‌
US Patent 7741626 Spectral purity filters and methods therefor
‌
US Patent 7745782 Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope
‌
US Patent 7745788 Optical trapping with a semiconductor
‌
US Patent 7750292 Mass spectrometer system
‌
US Patent 7750324 Charged particle beam lithography apparatus and charged particle beam lithography method
‌
US Patent 7750328 Filling system for potentially hazardous materials
‌
US Patent 7755034 Ion trap and a method for dissociating ions in an ion trap
‌
US Patent 7755046 Transmission electron microscope
‌
US Patent 7759643 Single electrode corona discharge electrochemical/electrospray ionization
‌
US Patent 7759655 Pulsed ion source for quadrupole mass spectrometer and method
‌
US Patent 7759873 Electronic lamp identification system
‌
US Patent 7763862 Method of aberration correction and electron beam system
‌
US Patent 7763871 Radiation source
‌
US Patent 7765606 Scanning probe apparatus
‌
US Patent 7767960 Multi-electrode ion trap
‌
US Patent 7767978 Ultraviolet water treatment device
‌
US Patent 7767988 Particle therapy system
‌
US Patent 7770231 Fast-scanning SPM and method of operating same
‌
US Patent 7772547 Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration
‌
US Patent 7772549 Multiplexed tandem mass spectrometry
‌
US Patent 7772551 Refractive index variable element and method of varying refractive index
‌
US Patent 7772564 Particle-optical apparatus equipped with a gas ion source
‌
US Patent 7772565 Radiation-shielding assembly having container location feature
‌
US Patent 7772568 Micro sample heating probe and method of producing the same, and analyzer using the micro sample heating probe
‌
US Patent 7772574 Pattern lock system for particle-beam exposure apparatus
‌
US Patent 7777179 Two-grid ion energy analyzer and methods of manufacturing and operating
‌
US Patent 7777182 Method and apparatus for ion cyclotron spectrometry
‌
US Patent 7777194 Charged particle beam apparatus
‌
US Patent 7777206 Ion implantation device control method, control system thereof, control program thereof, and ion implantation device
‌
US Patent 7781749 Beam irradiation apparatus with deep ultraviolet light emission device for lithographic pattern inspection system
‌
US Patent 7782512 Light irradiation device, fine particle analyzing apparatus, and light irradiation method
‌
US Patent 7785060 Multi-directional mechanical scanning in an ion implanter
‌
US Patent 7786433 Phantom and method for quality monitoring of a medical system
‌
US Patent 7786437 Pattern inspection method and pattern inspection system
‌
US Patent 7786455 Laser-driven light source
‌
US Patent 7791020 Multistage gas cascade amplifier
‌
US Patent 7791051 Configuration management and retrieval system for proton beam therapy system
‌
US Patent 7795580 Sample introduction device for mass spectrometer
‌
US Patent 7795581 Pattern measuring method and electron microscope
‌
US Patent 7795597 Deflector array, exposure apparatus, and device manufacturing method
‌
US Patent 7795601 Method and apparatus to improve lithography throughput
‌
US Patent 7800053 Method of evaluating ion irradiation effect, process simulator and device simulator
‌
US Patent 7800054 Fast time-of-flight mass spectrometer with improved dynamic range
‌
US Patent 7800059 Method of forming a sample image and charged particle beam apparatus
‌
US Patent 7800063 Manipulator for rotating and translating a sample holder
‌
US Patent 7800085 Microelectronic multiple electron beam emitting device
‌
US Patent 7804064 In-situ droplet monitoring for self-tuning spectrometers
‌
US Patent 7804065 Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics
‌
US Patent 7807980 Charged particle beam apparatus and methods for capturing images using the same
‌
US Patent 7807985 Ion beam inspection apparatus, ion beam inspecting method, semiconductor manufacturing apparatus, and ion source apparatus
‌
US Patent 7812310 Charged particle beam apparatus and specimen holder
‌
US Patent 7812322 Radiation-shielding assemblies and methods
‌
US Patent 7820963 Method for generation and use of isotopic patterns in mass spectral data of simple organisms
‌
US Patent 7820981 Method and apparatus for extending equipment uptime in ion implantation
‌
US Patent 7825373 Data acquisition system for a spectrometer using horizontal accumulation
‌
US Patent 7825390 Apparatus with plasma radiation source and method of forming a beam of radiation and lithographic apparatus
‌
US Patent 7825391 Plasma-based EUV light source
‌
US Patent 7829852 Device having etched feature with shrinkage carryover
‌
US Patent 7829854 Pixel architecture for thermal imaging system
‌
US Patent 7829866 Broad energy-range ribbon ion beam collimation using a variable-gradient dipole
‌
US Patent 7829871 Sheet beam-type testing apparatus
‌
US Patent 7829872 UV reactive spray chamber for enhanced sample introduction efficiency
‌
US Patent 7834331 Plasmonic laser nanoablation methods
‌
US Patent 7835057 Method of calibrating light delivery systems, light delivery systems and radiometer for use therewith
‌
US Patent 7838822 Linear FAIMS power supply
‌
US Patent 7838839 Hybrid multibeam electronic emission device with controlled divergence
‌
US Patent 7838840 Charged particle beam apparatus
‌
US Patent 7838850 External cathode ion source
‌
US Patent 7838856 Collimator fabrication
‌
US Patent 7840300 Full spectrum lapidary 3D image scanner and method
‌
US Patent 7842918 Chemical structure-insensitive method and apparatus for dissociating ions
‌
US Patent 7843632 EUV optics
‌
US Patent 7847240 Mass spectroscopy system and method including an excitation gate
‌
US Patent 7847242 Pulse heating-time of flight mass spectrometric gas elements analyzer
‌
US Patent 7847243 Ion trapping
‌
US Patent 7847245 Multiplexing matrix-analyte stereo electronic interactions for high throughput shotgun metabolomics
‌
US Patent 7847266 Device and method for selecting an emission area of an emission pattern
‌
US Patent 7847273 Carbon nanotube electron gun
‌
US Patent 7851743 Ion mobility spectrometer
‌
US Patent 7851746 Calibration curves for time-of-flight mass spectrometers
‌
US Patent 7851757 Phase plate for electron microscope and method for manufacturing same
‌
US Patent 7858955 System and method of controlling broad beam uniformity
‌
US Patent 7863562 Method and apparatus for digital differential ion mobility separation
‌
US Patent 7868290 Material processing system and method
‌
US Patent 7872224 Apparatus and method for positioning a discharge tube with respect to an orifice
‌
US Patent 7872231 Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscope
‌
US Patent 7872244 Lithographic apparatus and device manufacturing method
‌
US Patent 7875851 Advanced process control framework using two-dimensional image analysis
‌
US Patent 7875859 Ion energy analyzer and methods of manufacturing and operating
‌
US Patent 7875867 Non-ambipolar radio-frequency plasma electron source and systems and methods for generating electron beams
‌
US Patent 7880136 Multiple ion injection in mass spectrometry
‌
US Patent 7880151 Beam positioning for beam processing
‌
US Patent 7880153 Extreme ultra violet light source apparatus
‌
US Patent 7884320 Ion mobility spectrometer with substance collector
‌
US Patent 7884323 Atom probes, atom probe specimens, and associated methods
‌
US Patent 7884326 Manipulator for rotating and translating a sample holder
‌
US Patent 7888633 Evaluation of spectra in oscillation mass spectrometers
‌
US Patent 7888636 Measuring energy contamination using time-of-flight techniques
‌
US Patent 7888639 Method and apparatus for processing a micro sample
‌
US Patent 7888643 Focusing and positioning device for a particle-optical raster microscope
‌
US Patent 7888655 Transfer mechanism for transferring a specimen
‌
US Patent 7891015 High-bandwidth actuator drive for scanning probe microscopy
‌
US Patent 7897935 Radiopharmaceutical purification
‌
US Patent 7897936 Method and apparatus for specimen fabrication
‌
US Patent 7897939 Removable liners for charged particle beam systems
‌
US Patent 7897940 Removable liners for charged particle beam systems
‌
US Patent 7897946 Crystallization apparatus, crystallization method, device, and light modulation element
‌
US Patent 7897947 Laser produced plasma EUV light source having a droplet stream produced using a modulated disturbance wave
‌
US Patent 7902499 Ionization method and apparatus using electrospray
‌
US Patent 7902501 Ion mobility spectrometer and method for operation
‌
US Patent 7902529 Method and apparatus for selectively providing electrons in an ion source
‌
US Patent 7902530 Multiple medical accelerators and a kV-CT incorporated radiation therapy device and semi-automated custom reshapeable blocks for all field synchronous image guided 3-D-conformal-intensity modulated radiation therapy
‌
US Patent 7902531 Window assembly for irradiating infrared light
‌
US Patent 7905199 Method and system for directional growth using a gas cluster ion beam
‌
US Patent 7910879 Method and apparatus for time-of-flight mass spectrometry
‌
US Patent 7910886 Sample dimension measuring method and scanning electron microscope
‌
US Patent 7910887 Electron-beam device and detector system
‌
US Patent 7910895 Luminous body, electron beam detector using the same, scanning electron microscope, and mass analysis device
‌
US Patent 7910896 Micro discharge device ionizer and method of fabricating the same
‌
US Patent 7910898 Method and apparatus of measuring beam current waveforms
‌
US Patent 7910900 Collector for an illumination system
‌
US Patent 7915584 TEM with aberration corrector and phase plate
‌
US Patent 7915597 Extraction electrode system for high current ion implanter
‌
US Patent 7918293 Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume
‌
US Patent 7919759 Charged particle beam irradiator and rotary gantry
‌
US Patent 7921466 Method of using an atomic force microscope and microscope
‌
US Patent 7921804 Plasma generating nozzle having impedance control mechanism
‌
US Patent 7923683 Method for treatment of samples for transmission electron microscopes
‌
US Patent 7923706 Ultraviolet curing apparatus for continuous material
‌
US Patent 7923707 Disinfecting device utilizing ultraviolet radiation
‌
US Patent 7923708 Radiation shielding sheet
‌
US Patent 7928359 Thermal management technology for polarizing Xenon
‌
US Patent 7928363 Mass spectrometer
‌
US Patent 7928400 X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications
‌
US Patent 7932487 Mass spectrometer with looped ion path
‌
US Patent 7932488 Concentrating mass spectrometer ion guide, spectrometer and method
‌
US Patent 7932490 Size segregated aerosol mass concentration measurement device
‌
US Patent 7932493 Method and system for observing a specimen using a scanning electron microscope
‌
US Patent 7932501 Particle-beam exposure apparatus and particle-beam therapeutic apparatus
‌
US Patent 7935927 Method and apparatus for observing a specimen
‌
US Patent 7935937 Method of forming TEM sample holder
‌
US Patent 7935945 Ion implantation method and apparatus
‌
US Patent 7935946 Ion implantation method and apparatus
‌
US Patent 7939799 Tandem fourier transform ion cyclotron resonance mass spectrometer
‌
US Patent 7939811 Microscale fluid transport using optically controlled marangoni effect
‌
US Patent 7943914 Back illumination method for counter measuring IR guided missiles
‌
US Patent 7947948 Two-dimensional radial-ejection ion trap operable as a quadrupole mass filter
‌
US Patent 7947964 Charged particle beam orbit corrector and charged particle beam apparatus
‌
US Patent 7947969 Stacked conformation radiotherapy system and particle beam therapy apparatus employing the same
‌
US Patent 7952071 Apparatus and method for inspecting sample surface
‌
US Patent 7952083 Ion beam system and machining method
‌
US Patent 7956323 Ion mobility spectrometer and method for determining an analyte substance or an analyte substance mixture in the presence of a dopant mixture by means of an ion mobility spectrometer
‌
US Patent 7960691 Second ion mass spectrometry method and imaging method
‌
US Patent 7960711 Field-free electrospray nebulizer
‌
US Patent 7961397 Single-channel optical processing system for energetic-beam microscopes
‌
US Patent 7961844 Rotating irradiation therapy apparatus
‌
US Patent 7964856 Ion implanting apparatus
‌
US Patent 7968839 Miniaturized optical tweezers based on high-NA micro-mirrors
‌
US Patent 7973279 Method and device for generating positively and/or negatively ionized gas analytes for gas analysis
‌
US Patent 7973282 Charged particle beam apparatus and dimension measuring method
‌
US Patent 7977648 Scanning aperture ion beam modulator
‌
US Patent 7982181 Methods for identifying an apex for improved data-dependent acquisition
‌
US Patent 7985952 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
‌
US Patent 7985957 Methods for concealing surface defects
‌
US Patent 7989778 Charged-particle optical system with dual loading options
‌
US Patent 7994474 Laser desorption ionization ion source with charge injection
‌
US Patent 7994484 Stage apparatus and exposure apparatus
‌
US Patent 7999241 Extreme ultraviolet light source apparatus
‌
US Patent 8003938 Apertured diaphragms between RF ion guides
‌
US Patent 8003963 Extreme ultraviolet light source apparatus
‌
US Patent 8006316 Scanning ion conductance microscopy for the investigation of living cells
‌
US Patent 8013294 Charged-particle detector
‌
US Patent 8013315 Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same
Edits on 13 Dec, 2021
Golden AI profile picture
Golden AI
edited on 13 Dec, 2021
Golden AI profile picture
Golden AI
edited on 13 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8013294 Charged-particle detector
Edits on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8006316 Scanning ion conductance microscopy for the investigation of living cells
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8003963 Extreme ultraviolet light source apparatus
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8003938 Apertured diaphragms between RF ion guides
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7999241 Extreme ultraviolet light source apparatus
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7994484 Stage apparatus and exposure apparatus
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7994474 Laser desorption ionization ion source with charge injection
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7989778 Charged-particle optical system with dual loading options
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7985957 Methods for concealing surface defects
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7985952 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7982181 Methods for identifying an apex for improved data-dependent acquisition
Edits on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7977648 Scanning aperture ion beam modulator
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7973282 Charged particle beam apparatus and dimension measuring method
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7968839 Miniaturized optical tweezers based on high-NA micro-mirrors
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7964856 Ion implanting apparatus
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7961844 Rotating irradiation therapy apparatus
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7961397 Single-channel optical processing system for energetic-beam microscopes

Find more people like Bernard E Souw

Use the Golden Query Tool to discover related individuals, professionals, or experts with similar interests, expertise, or connections in the Knowledge Graph.
Open Query Tool
Access by API
Golden Query Tool
Golden logo
By using this site, you agree to our Terms of Service.