US Patent 7960691 Second ion mass spectrometry method and imaging method

Patent 7960691 was granted and assigned to Kyoto University on June, 2011 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Kyoto University

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

7960691

Patent Inventor Names

Jiro Matsuo0

Date of Patent

June 14, 2011

Patent Application Number

12308326

Date Filed

June 13, 2007

Patent Primary Examiner

‌

Bernard E Souw

Patent abstract

The provision of a new method for analyzing organic molecules such as protein and endocrine disrupting chemicals with excellent sensitivity. A secondary ion mass spectrometry method using a heavy ion beam as a primary ion beam enables the detection of, for example, an organism-related material at the sub-amol level with high sensitivity. As a result, favorable imaging of an organism-related sample can be performed.