US Patent 7960691 Second ion mass spectrometry method and imaging method
Patent 7960691 was granted and assigned to Kyoto University on June, 2011 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
June 13, 2007
Date of Patent
June 14, 2011
Patent Application Number
12308326
Patent Inventor Names
Jiro Matsuo
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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