US Patent 7960691 Second ion mass spectrometry method and imaging method
Patent 7960691 was granted and assigned to Kyoto University on June, 2011 by the United States Patent and Trademark Office.
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Patent abstract
The provision of a new method for analyzing organic molecules such as protein and endocrine disrupting chemicals with excellent sensitivity. A secondary ion mass spectrometry method using a heavy ion beam as a primary ion beam enables the detection of, for example, an organism-related material at the sub-amol level with high sensitivity. As a result, favorable imaging of an organism-related sample can be performed.
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Patent Inventor Names
Jiro Matsuo0
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US Patent 07960691 Second ion mass spectrometry method and imaging method US Patent 7960691 Second ion mass spectrometry method and imaging method
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Patent Number
07960691
Patent Number
7960691
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US Patent 07960691 Second ion mass spectrometry method and imaging method
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Is a
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Patent jurisdiction
Patent number
07960691
Date of patent
June 14, 2011
Patent application number
12308326
Date Filed
June 13, 2007
Patent primary examiner
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