L. G. Lauchman

US Patent 7268861 Near infrared chemical imaging microscope

US Patent 7286215 Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatus

US Patent 7365834 Optical system for detecting anomalies and/or features of surfaces

US Patent 7375814 Natural gas leak mapper

US Patent 7375828 Modal method modeling of binary gratings with improved eigenvalue computation

US Patent 7379172 Method and apparatus for inspection of optical component

US Patent 7379177 System and method for performing hard glass inspection

US Patent 7382459 Spectroscopic gas sensor, in particular for detecting at least one gas component in the ambient air, and method for manufacturing a spectroscopic gas sensor of this type

US Patent 7382461 Analysis method and apparatus utilizing attenuated total reflection

US Patent 7385698 System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems

US Patent 7388666 Probe assembly with a light hood and a detecting instrument equipped with the same

US Patent 7388680 Gap monitor arrangement

US Patent 7391514 Colorimeter

US Patent 7391516 Optical element for measuring information of living body and device for measuring information of living body using the optical element

US Patent 7391518 Device and method for the determination of the quality of surfaces

US Patent 7391523 Curvature/tilt metrology tool with closed loop feedback control

US Patent 7394535 Optical metrology using a photonic nanojet

US Patent 7400412 Co-ordinate measuring instrument

US Patent 7400414 Hand-size structured-light three-dimensional metrology imaging system and method

US Patent 7400417 Diffraction method for measuring thickness of a workpart

US Patent 7403277 Method and apparatus for measuring face angle

US Patent 7403280 Fiber coupling into bent capillary

US Patent 7403284 Integrated optics based high-resolution spectrophotometer

US Patent 7403287 Sensing element used in sensing device for sensing target substance in specimen by using plasmon resonance

US Patent 7405820 Optical spectrum analyzing device by means of Brillouin scattering and associated measurement process

US Patent 7405826 Systems and methods for chiroptical heterodyning

US Patent 7411675 Optical rotation angle measuring apparatus

US Patent 7414713 Method of measuring focal point, instrument used therefor, and method of fabricating semiconductor device

US Patent 7414722 Alignment measurement arrangement and alignment measurement method

US Patent 7414726 Gas analyzer systems and methods

US Patent 7417725 Illumination method and device for detecting surface defects and/or material shortage on the neck ring of a container

US Patent 7417732 Particle monitoring apparatus and vacuum processing apparatus

US Patent 7420666 Measurement method by OTDR and terminal station apparatus

US Patent 7420675 Multi-wavelength imaging system

US Patent 7420682 Sensor device for interference and plasmon-waveguide/interference spectroscopy

US Patent 7423738 Inspecting system for security documents

US Patent 7423744 Method for marking defect and device therefor

US Patent 7425719 Method and apparatus for selectively providing data from a test head to a processor

US Patent 7426025 Nanostructures, systems, and methods including nanolasers for enhanced Raman spectroscopy

US Patent 7426028 Spectroscopic feedback for high density data storage and micromachining

US Patent 7426029 Color measurement using compact device

US Patent 7428043 Apparatus for ascertaining the light power level of a light beam, and scanning microscope

US Patent 7428050 Multispectral, multifusion, laser-polarimetric optical imaging system

US Patent 7428060 Optimization of diffraction order selection for two-dimensional structures

US Patent 7429479 Inverted orientation for a microplate

US Patent 7430038 Apparatus for enhancing visualization of mechanical stress

US Patent 7433031 Defect review system with 2D scanning and a ring detector

US Patent 7433032 Method and apparatus for inspecting defects in multiple regions with different parameters

US Patent 7433037 System for measuring periodic structures

US Patent 7433038 Alignment of substrates for bonding

US Patent 7436499 Plastic packaging having a marker material

US Patent 7436500 Near infrared chemical imaging microscope

US Patent 7436506 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool

US Patent 7436511 Analyte filter method and apparatus

US Patent 7436524 Apparatus and method for three-dimensional measurement and program for allowing computer to execute method for three-dimensional measurement

US Patent 7436526 Real-time system for monitoring and controlling film uniformity and method of applying the same

US Patent 7440088 Methods and devices for measuring a concentrated light beam

US Patent 7440099 Droplets detecting system

US Patent 7440103 Inspection apparatus of wiring pattern, inspection method, detection apparatus, detection method

US Patent 7443500 Apparatus for scattered light inspection of optical elements

US Patent 7446872 Positioning apparatus and positioning method using the same

US Patent 7450225 Correction of optical metrology for focus offset

US Patent 7450231 Deviation angle self compensating substantially achromatic retarder

US Patent 7450234 Cylindrical lens-based light sensor and use of the sensor in an automated method and apparatus for monitoring a target fluid for contaminants

US Patent 7450251 Fanned laser beam metrology system

US Patent 7453567 Fluorescence lifetime distribution image measuring system and its measuring method

US Patent 7453580 Three-dimensional image measuring apparatus

US Patent 7456947 Inspecting apparatus and inspecting method

US Patent 7456952 System for real-time fluorescent determination of trace elements

US Patent 7456965 Optical measurements of properties in substances using propagation modes of light

US Patent 7456970 Pulse finding apparatus and method

US Patent 7456971 Optical gas sensing apparatus

US Patent 7460222 Measuring device for the optical analysis of a test strip

US Patent 7460223 Inverted orientation for a microplate

US Patent 7460230 Deviation angle self compensating substantially achromatic retarder

US Patent 7460238 Plasmon excitation by the gaussian-like core mode of a photonic crystal waveguide

US Patent 7463343 Sensing systems and methods for differentiating between different cellular blood species during extracorporeal blood separation or processing

US Patent 7463355 Nondestructive optical technique for simultaneously measuring optical constants and thickness of thin films

US Patent 7463367 Estimating overlay error and optical aberrations

US Patent 7466406 Analyte detection using nanowires produced by on-wire lithography

US Patent 7466414 Position detection apparatus and method

US Patent 7466418 Fluorescence illumination assembly for an imaging apparatus and method

US Patent 7468788 Systems and methods for chiral detection and analysis

US Patent 7468790 Detecting gaseous species by light-emission spectrometry with spectrum processing

US Patent 7468792 Evaluation apparatus and evaluation method

US Patent 7471378 Method and system for determining a polarization dependent characteristics of optical and opto-electrical devices

US Patent 7471381 Method and apparatus for bump inspection

US Patent 7471387 System and method for the electrostatic detection and identification of threat agents

US Patent 7471395 Light-emitting module and methods for optically aligning and assembling the same

US Patent 7474396 Raman spectroscopy system and method using a subwavelength resonant grating filter

US Patent 7474398 Illumination system for an imaging apparatus with low profile output device

US Patent 7474399 Dual illumination system for an imaging apparatus and method

US Patent 7474404 Voltage sensor capable of contactless voltage measurement

US Patent 7474416 System and method for measuring an object and monitoring the surface of an object

US Patent 7474418 Position measurement system

US Patent 7474419 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus

US Patent 7477364 Miniaturized system and method for measuring optical characteristics

US Patent 7477365 Optical spot geometric parameter determination using calibration targets

US Patent 7477368 Relayed pupil optical control system

US Patent 7477371 Process and assembly for non-destructive surface inspections

US Patent 7477382 Atomic absorption spectrometer

US Patent 7477386 Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices

US Patent 7477388 Sample masking in ellipsometer and the like systems including detection of substrate backside reflections

US Patent 7477389 Deformable photoelastic device

US Patent 7477391 Miniaturized system and method for measuring optical characteristics

US Patent 7477400 Range and speed finder

US Patent 7480050 Lithographic system, sensor, and method of measuring properties of a substrate

US Patent 7483125 Method for wavelength independent dispersion penalty measurement

US Patent 7483132 Analysis of a material in particulate form

US Patent 7483135 Confocal spectrometer with astigmatic aperturing

US Patent 7483136 Refractive index matching in capillary illumination

US Patent 7483151 Active 3D triangulation-based imaging method and device

US Patent 7486390 Device and process for alignment of machines, machine parts or other technical articles

US Patent 7486397 Device for aligning substrate with mask and method using the same

US Patent 7486399 Method for mapping a natural gas leak

US Patent 7486400 Plasmon resonance structure with metal nanoparticle layers

US Patent 7486409 Displacement sensor

US Patent 7489392 Systems and methods for using light to indicate inconsistency locations on a composite structure

US Patent 7489394 Apparatus for inspecting a disk-like object

US Patent 7489411 Apparatus and methods for calibrating a laser projection device

US Patent 7492450 Methods and apparatus for inspecting an object

US Patent 7492455 Discrete polarization state spectroscopic ellipsometer system and method of use

US Patent 7492459 Optical droplet sensor and method

US Patent 7495761 Array detector coupled spectroanalytical system and graded blaze angle grating

US Patent 7495767 Digital optical method (DOM™) and system for determining opacity

US Patent 7495777 Method and apparatus for contact free measurement of periodically moving objects

US Patent 7499154 Readhead for optical inspection apparatus

US Patent 7499163 System and method for applying correction factors related to ambient conditions

US Patent 7499164 Systems and methods for profiling and synchronizing a fleet of color measurement instruments

US Patent 7499172 Multi-grade object sorting system and method

US Patent 7499183 Method of measuring sub-micron trench structures

US Patent 7499185 Measuring device for workpiece held on chuck table

US Patent 7502100 Three-dimensional position measurement method and apparatus used for three-dimensional position measurement

US Patent 7502103 Metrology tool, system comprising a lithographic apparatus and a metrology tool, and a method for determining a parameter of a substrate

US Patent 7502108 Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics

US Patent 7505122 Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric appliance having light-emitting element

US Patent 7505135 Method and apparatus for imaging through scattering or obstructing media

US Patent 7508499 Methods for application of a tag onto a media article

US Patent 7508501 Method for measuring spectroscopic properties of bulk products and device for carrying out said method

US Patent 7508504 Automatic wafer edge inspection and review system

US Patent 7508514 Correction of off-axis translation of optical elements in an optical zoom assembly

US Patent 7508518 Particle measuring method and particle measuring apparatus

US Patent 7508521 Pressure-invariant trace gas detection

US Patent 7508530 Multi-point position measuring and recording system for anthropomorphic test devices

US Patent 7511807 Method and apparatus for detection of inclusion in glass

US Patent 7511808 Analyte stages including tunable resonant cavities and Raman signal-enhancing structures

US Patent 7511809 Air sampler module for enhancing the detection capabilities of a chemical detection device or system

US Patent 7511829 Method and apparatus for colour imaging a three-dimensional structure

US Patent 7511833 System for obtaining information about vehicular components

US Patent 7511835 Optical metrology using a support vector machine with simulated diffraction signal inputs

US Patent 7515263 Optical spark mode discriminator methods and systems

US Patent 7515265 Imaging systems and methods to improve backscattering imaging using circular polarization memory

US Patent 7515281 Lithographic apparatus and device manufacturing method

US Patent 7518711 Optical waveform measurement apparatus and optical waveform measurement method

US Patent 7518724 Image acquisition, processing, and display

US Patent 7518725 Temperature controlled lens

US Patent 7522274 Radiometers

US Patent 7522278 Real-time linear-birefringence-detecting polarization microscope

US Patent 7522281 Apparatus and method for detecting moisture in a printing plate exposer

US Patent 7522294 Measuring a process parameter of a semiconductor fabrication process using optical metrology

US Patent 7525647 Medical device probe with source and detector sensors

US Patent 7525653 Spectroscopic chemical analysis methods and apparatus

US Patent 7525657 System and method for active optical target detection with polarized receiver

US Patent 7525661 Laser photo-thermo-acoustic (PTA) frequency swept heterodyned lock-in depth profilometry imaging system

US Patent 7525667 Portable electronic measurement

US Patent 7525673 Optimizing selected variables of an optical metrology system

US Patent 7528940 System and method for inspecting an object using an acousto-optic device

US Patent 7528941 Order selected overlay metrology

US Patent 7528944 Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool

US Patent 7528948 Controllable surface enhanced Raman spectroscopy

US Patent 7528951 Optical design of a measurement system having multiple sensor or multiple light source paths

US Patent 7528956 Miniaturized system and method for measuring optical characteristics

US Patent 7528966 Position detection apparatus and exposure apparatus

US Patent 7532317 Scatterometry method with characteristic signatures matching

US Patent 7532319 Apparatus for calibrating displacement of reflective parts in diffractive optical modulator

US Patent 7532325 Method and apparatus for the separation of fluoroscence and elastic scattering produced by broadband illumination using polarization discrimination techniques

US Patent 7532332 Projector for an arrangement for three-dimensional optical measurement of objects

US Patent 7535561 Defect inspecting apparatus

US Patent 7535563 Systems configured to inspect a specimen

US Patent 7535566 Beam chromatic shifting and directing means

US Patent 7538865 Source and detector sensor arrangement

US Patent 7538873 Method for simulating the movement of particles

US Patent 7538875 Lithographic apparatus and methods for use thereof

US Patent 7542133 Photo-detector filter

US Patent 7542136 Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput

US Patent 7545488 Apparatus for implementing a light-emitting diode meter

US Patent 7545496 Support with a surface structure for sensitive evanescent-field detection

US Patent 7545512 Method for automated measurement of three-dimensional shape of circuit boards

US Patent 7545514 Pick and place machine with improved component pick image processing

US Patent 7551276 Method and apparatus for detecting optical spectra

US Patent 7551280 Method for manufacturing optical element, method for manufacturing projector, optical element and projector

US Patent 7554662 Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation

US Patent 7557923 Method and system for in situ spectroscopic evaluation of an object

US Patent 7561282 Techniques for determining overlay and critical dimension using a single metrology tool

US Patent 7564553 Polarization evaluation mask, polarization evaluation method, and polarization determination device

US Patent 7564555 Method and apparatus for angular-resolved spectroscopic lithography characterization

US Patent 7567345 Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample

US Patent 7567351 High resolution monitoring of CD variations

US Patent 7570356 System and method for classifying cells and the pharmaceutical treatment of such cells using Raman spectroscopy

US Patent 7570357 Visible/near-infrared spectrometry and its device

US Patent 7570370 Method and an apparatus for the determination of the 3D coordinates of an object

US Patent 7573576 Optical sensor device

US Patent 7573585 Detection apparatus detecting predetermined positions of member

US Patent 7576842 Random-type identifying material, 3-D identifying system and method using the same

US Patent 7580118 Methods, apparatus, and systems for evaluating gemstones

US Patent 7580122 Image inspection method by polarized compensation for deformation of lens

US Patent 7583379 Surface enhanced raman spectroscopy (SERS) systems and methods of use thereof

US Patent 7586607 Polarization imaging

US Patent 7593102 Polarization evaluation mask, polarization evaluation method, and polarization determination device

US Patent 7593104 Method for manufacturing optical module, positioning apparatus, evaluation method and evaluation apparatus for evaluating optical module

US Patent 7593107 Method and system for diffusion attenuated total reflection based concentration sensing

US Patent 7595879 Optically measuring substances using propagation modes of light

US Patent 7599052 Method for marking defect and device therefor

US Patent 7599058 Methods for plasma diagnostics and the measurement of thin films

US Patent 7599064 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method, substrate for use in the methods

US Patent 7602486 Coolant passage inspection device and method of vehicle cylinder head coolant passage blockage detection

US Patent 7605916 Online analyte detection by surface enhanced Raman scattering (SERS)

US Patent 7605917 Spectrometer

US Patent 7609375 Optical cavity for gas sensor

US Patent 7612879 Method and device for three-dimensionally determining the refractive index of transparent or partially transparent layers

US Patent 7612882 Optical gratings, lithography tools including such optical gratings and methods for using same for alignment

US Patent 7616295 Biometric identification apparatus

US Patent 7616296 Machine for detecting sheet-like object, and validating machine using the same

US Patent 7616299 Surface inspection method and surface inspection apparatus

US Patent 7616326 Proximity-leveraging, transverse displacement sensor apparatus and method

US Patent 7619727 Apparatus for detecting wavelength and measuring optical power

US Patent 7619735 Optical inspection using variable apodization

US Patent 7619736 Apparatus and method for obtaining sample information by detecting electromagnetic wave

US Patent 7619737 Method of measurement, an inspection apparatus and a lithographic apparatus

US Patent 7619738 Marker structure for optical alignment of a substrate, a substrate including such a marker structure, an alignment method for aligning to such a marker structure, and a lithographic projection apparatus

US Patent 7623239 Systems and methods for measurement of a specimen with vacuum ultraviolet light

US Patent 7623241 Method for automatic color matching of transparent wood stains

US Patent 7623243 Spectroscopic device

US Patent 7630077 System and method for imaging through an irregular water surface

US Patent 7639348 Stress measuring method and instrument

US Patent 7639352 Detection device for identifying objects in a material stream

US Patent 7639353 Method, device and system for evaluating a lens for an electronic device

US Patent 7646486 Modulated reflectance measurement system using UV probe

US Patent 7656514 Method and apparatus for evaluating semiconductor layers

US Patent 7656522 Depth selective pH measurement and UV exposure measurement

US Patent 7656523 Multiplexed raman detection with filter set

US Patent 7656525 Fiber optic SERS sensor systems and SERS probes

US Patent 7656528 Periodic patterns and technique to control misalignment between two layers

US Patent 7656529 Overlay error measurement using fourier optics

US Patent 7659977 Apparatus and method for imaging with surface enhanced coherent anti-stokes raman scattering (SECARS)

US Patent 7663739 Customizable spectral profiles for filtering

US Patent 7663746 Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool

US Patent 7663752 Polarization modulation imaging ellipsometer

US Patent 7671985 Device for small spot analysis using fiber optic interfaced spectrometers

US Patent 7671989 Information maintenance during intensity attenuation in focused beams

US Patent 7671992 Measurement system and scanning device for the photoelectric measurement of a measurement object pixel by pixel

US Patent 7675620 Optical property measuring method and optical property measuring apparatus

US Patent 7679735 Optical system for detecting anomalies and/or features of surfaces

US Patent 7684028 Remote sensing digital angle gauge

US Patent 7688428 Non-contact oil spill detection apparatus and method

US Patent 7688450 Hydrogel-actuated micromirrors for optical sensing

US Patent 7692791 Target substance-detecting apparatus and target substance-detecting method

US Patent 7697134 Correlation spectrometer

US Patent 7705982 Methods and apparatus for analyzing fluid properties of emulsions using fluorescence spectroscopy

US Patent 7705985 Method and apparatus for testing fibres

US Patent 7710554 Apparatus for monitoring the alignment of marking lasers

US Patent 7710555 Apparatus and method for determining the orientation of an object such as vehicle wheel alignment

US Patent 7710559 Calibration reference light source and calibration system using the same

US Patent 7710581 Wavelength monitoring method and apparatus and method of making same

US Patent 7733489 Optical method of multi-band mixing

US Patent 7738086 Active CMOS biosensor chip for fluorescent-based detection

US Patent 7738095 Method and apparatus for compact spectrometer for detecting hazardous agents

US Patent 7738096 Surface enhanced Raman spectroscopy (SERS) systems, substrates, fabrication thereof, and methods of use thereof

US Patent 7742166 Enhancing selectivity and/or sensitivity of spectroscopic measurements in media

US Patent 7746456 Apparatus for contactless 3D wheel alignment, system and method therefor

US Patent 7746474 Color identifying device for identifying colors of reaction surfaces produced by chemical reaction and gas identifying device

US Patent 7751044 Optical sensors for downhole measurements using birefringent materials

US Patent 7755771 Noncontact method for measuring pitch of gear teeth and screw

US Patent 7760340 Sample analyzer

US Patent 7760358 Film measurement

US Patent 7764375 Imaging device for imaging microscopic or macroscopic objects

US Patent 7768640 Fluorescence detection enhancement using photonic crystal extraction

US Patent 7768644 Miniaturized system and method for measuring optical characteristics

US Patent 7773201 Alignment of optical system components using an ADM beam through a null assembly

US Patent 7773211 Apparatus and method for determining stress in solar cells

US Patent 7773219 Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering

US Patent 7791719 Using a fixed-frequency oscillation to detect and measure scene inhomogeneity

US Patent 7796240 Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, and light-emitting device and electric appliance having light-emitting element

US Patent 7796247 Tissue oximeter with source and detector sensors

US Patent 7796260 System and method of controlling intensity of an electromagnetic beam

US Patent 7800753 Spectroscopic chemical analysis methods and apparatus

US Patent 7804597 Method for matching paint

US Patent 7808635 Wide swath imaging spectrometer utilizing a multi-modular design

US Patent 7808657 Wafer and stage alignment using photonic devices

US Patent 7812944 Array for optical evaluation of an object array

US Patent 7812947 Apparatus and method for measuring and/or controlling paper pulp properties

US Patent 7812948 Different-kind-of-object detector employing plane spectrometer

US Patent 7812949 Spectrometer with cylindrical lens for astigmatism correction and demagnification

US Patent 7817271 Confocal microscope and method for detecting by means of a confocal microscope

US Patent 7821633 Apparatus and method for Raman spectroscopy and microscopy with time domain spectral analysis

US Patent 7821639 Color measuring head and scanner device equipped therewith

US Patent 7821652 System and method for focusing discrete points on an under-measured object

US Patent 7821654 System for scatterometric measurements and applications

US Patent 7826072 Method for optimizing the configuration of a scatterometry measurement system

US Patent 7834999 Optical analysis system and optical train

US Patent 7843568 Enhanced instrumentation and method for optical measurement of samples

US Patent 7847940 Methods and apparatus for correcting banding of imaged regular patterns

US Patent 7859655 Method involving a pointing instrument and a target object

US Patent 7859665 Polarization analyzing system, exposure method, and method for manufacturing semiconductor device

US Patent 7864316 Spectrometric characterization of pharmaceutical heterogeneity

US Patent 7864320 Method to minimize instrument differences in color management functions

US Patent 7869026 Targeted artifacts and methods for evaluating 3-D coordinate system measurement accuracy of optical 3-D measuring systems using such targeted artifacts

US Patent 7869062 Apparatus for supporting substrate, apparatus for measuring surface potential, apparatus for measuring film thickness, and apparatus for inspecting substrate

US Patent 7871183 Light source

US Patent 7872751 Fast sample height, AOI and POI alignment in mapping ellipsometer or the like

US Patent 7880876 Methods of use for surface enhanced raman spectroscopy (SERS) systems for the detection of bacteria

US Patent RE42143 Consumable tube for use with a flow cytometry-based hematology system

US Patent 7889332 Physical quantity measuring apparatus utilizing optical frequency domain reflectometry, and method for simultaneous measurement of temperature and strain using the apparatus

US Patent 7889334 Surface enhanced Raman spectroscopy (SERS) systems for the detection of bacteria and methods of use thereof

US Patent 7894062 Overlay measuring method and overlay measuring apparatus using the same

US Patent 7894064 Optical device for dispersing light

US Patent 7907259 Laser microdissection method, control system for a laser microdissection device and carrier device

US Patent 7907274 Method for characterizing x-ray detector materials using a Raman microscope

US Patent 7907280 Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation

US Patent 7907281 System and method for calibrating optical characteristics

US Patent 7911605 Multivariate optical elements for optical analysis system

US Patent 7916282 Surface detection system for use with a droplet spray oral cleaning device

US Patent 7916295 Alignment mark and method of getting position reference for wafer

US Patent 7920254 Shaft cone crown measurement system and methodology

US Patent 7920258 Optical analysis system and elements to isolate spectral region

US Patent 7924414 Non-hazardous bulk material analyzer system

US Patent 7924423 Reverse photoacoustic standoff spectroscopy

US Patent 7924425 Spatially selective fixed-optics multicolor fluorescence detection system for a multichannel microfluidic device, and method for detection

US Patent 7924440 Imaging apparatus for imaging integrated circuits on an integrated circuit carrier

US Patent 7933026 High resolution monitoring of CD variations

US Patent 7936453 Terahertz frequency domain spectrometer with integrated dual laser module

US Patent 7940387 Surface enhanced Raman spectroscopy (SERS) systems for the detection of viruses and methods of use thereof

US Patent 7940388 Spectrophotometer

US Patent 7940390 Compact background-free balanced cross-correlators

US Patent 7940394 Color distribution measuring optical system, color distribution measuring apparatus, and color distribution measuring method

US Patent 7944550 System and method for detecting local mechanical stress in integreated devices

US Patent 7944551 Systems and methods for a wavelet transform viewer

US Patent 7944558 Method and system for physicochemical analysis using a laser pulsed ablation

US Patent 7948623 Method for evaluating color filter, color filter and liquid crystal display device

US Patent 7952698 Method and device for contact angle determination from radius of curvature of drop by optical distance measurement

US Patent 7952705 Integrated microfluidic optical device for sub-micro liter liquid sample microspectroscopy

US Patent 7956991 Method and apparatus for interactive hyperspectral image subtraction

US Patent 7956998 Method and system for the polarmetric analysis of scattering media utilising polarization difference sensing (PDS)

US Patent 7956999 Resistivity testing method and device therefor

US Patent 7957001 Wavelength-modulation spectroscopy method and apparatus

US Patent 7961315 Fluorescence detection enhancement using photonic crystal extraction

US Patent 7965390 Automatic sample alignment system and method of use

US Patent 7969572 Particle monitor system and substrate processing apparatus

US Patent 7973914 Physical quantity measuring apparatus utilizing optical frequency domain reflectometry and method for temperature and strain measurement using the apparatus

US Patent 7973930 Spectroscopic ellipsometer

US Patent 7978317 Miniaturized system and method for measuring optical characteristics

US Patent 7978321 Angle measurements

US Patent 7995194 Virtual separation of bound and free label in a ligand assay for performing immunoassays of biological fluids, including whole blood

US Patent 7995200 Analyzer

US Patent 7999938 Measurements of optical inhomogeneity and other properties in substances using propagation modes of light

US Patent 8009278 Customizable spectral profiles for filtering