Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
December 16, 2008
0Patent Application Number
113725830
Date Filed
March 10, 2006
0Patent Primary Examiner
Patent abstract
The present invention relates to methods of detecting analytes using nanowires having nanodisk arrays. In particular, the present invention discloses methods of detecting analytes via surface enhanced Raman scattering (SERS) and employing nanowires prepared using on-wire lithography (OWL).
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