US Patent 7440088 Methods and devices for measuring a concentrated light beam

Patent 7440088 was granted and assigned to Applied Materials on October, 2008 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Current Assignee

Applied Materials

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

7440088

Date of Patent

October 21, 2008

Patent Application Number

11261439

Date Filed

October 28, 2005

Patent Primary Examiner

‌

L. G. Lauchman

Patent abstract

Methods and devices are provided for profiling a beam of light that includes a wavelength λ. The beam of light is received. Secondary light is generated at a wavelength λ′ different from wavelength λ by fluorescing a material with the received beam of light. The secondary light is separated from the received beam of light. The separated secondary light is optically directed to a sensor.