Patent attributes
A system and method to inspect objects for a characteristic parameter. The system includes at least one electromagnetic source for emitting at least two separate wavelengths of electromagnetic energy. At least one electromagnetic detector is positioned at a predefined distance from the electromagnetic source to measure an incident intensity value of the electromagnetic energy at the two wavelengths. An object, placed between the electromagnetic source and the electromagnetic detector is irradiated with electromagnetic energy at the two wavelengths and the electromagnetic energy transmitted through the object is measured by the electromagnetic detector. The system includes a computer-based platform operationally connected to the electromagnetic detector for receiving intensity data values from the electromagnetic detector and for computing attenuation ratio values. The attenuation ratio values are used to determine a level of the characteristic parameter.
