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Patrick J Connolly

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Edits on 14 Dec, 2021
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edited on 14 Dec, 2021
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Patent primary examiner of
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US Patent 7355720 Optical displacement sensor
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US Patent 7379190 Stage alignment in lithography tools
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US Patent 7382466 Coating for reflective optical components
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US Patent 7382468 Interferometer system, signal processing method in interferometer system, and stage using signal processing
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US Patent 7388669 Method of generating interferometric information
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US Patent 7388673 Heterodyne optical spectrum analyzer
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US Patent 7394549 Method and arrangement for optical coherence tomography
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US Patent 7400410 Optical coherence tomography for eye-length measurement
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US Patent 7403270 Method for whole field thin film stress evaluation
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US Patent 7403292 Fluid analysis element and fluid analysis apparatus
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US Patent 7403293 Metrology apparatus, lithographic apparatus, process apparatus metrology method and device manufacturing method
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US Patent 7405829 Apparatus and method for characterizing pulsed optical signals
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US Patent 7405834 Compensated coherent imaging for improved imaging and directed energy weapons applications
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US Patent 7411684 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method
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US Patent 7414730 High precision interferometer apparatus employing a grating beamsplitter
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US Patent 7417740 Single trace multi-channel low coherence interferometric sensor
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US Patent 7417742 Method for estimating the optical nonlinearity of a material
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US Patent 7417746 Fabry-perot tunable filter systems and methods
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US Patent 7420687 Condition assessment system for a structure including a semiconductor material
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US Patent 7420689 Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor
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US Patent 7426037 Diffraction grating based interferometric systems and methods
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US Patent 7428048 Imaging elastic scattering spectroscopy
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US Patent 7428052 Optical tomographic apparatus
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US Patent 7428057 Interferometer for determining characteristics of an object surface, including processing and calibration
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US Patent 7433024 Range mapping using speckle decorrelation
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US Patent 7433044 Sagnac fourier transform spectrometer having improved resolution
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US Patent 7433048 Interferometer systems for measuring displacement and exposure systems using the same
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US Patent 7433051 Determination of lithography misalignment based on curvature and stress mapping data of substrates
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US Patent 7436519 System and method for interferometer non-linearity compensation
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US Patent 7436521 Optical measuring apparatus and operating method for imaging error correction in an optical imaging system
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US Patent 7440116 Surface profiling apparatus with reference calibrator and method of calibrating same
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US Patent 7440117 Highly-sensitive displacement-measuring optical device
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US Patent 7450238 Device and method for spectrally resolving detection of a sample
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US Patent 7450240 Laser device coupled to a cavity by optical feedback for detecting gas traces
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US Patent 7460248 Tissue imaging system
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US Patent 7463362 Digital signal processor-based detection system, method, and apparatus for optical tomography
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US Patent 7466413 Marker structure, mask pattern, alignment method and lithographic method and apparatus
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US Patent 7466425 Elementary matrix based optical signal/network analyzer
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US Patent 7466428 Method of measuring thickness of thin layer in semiconductor device and apparatus for performing method
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US Patent 7468798 System and method for polarization characteristic measurement of optical systems via centroid analysis
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US Patent 7468799 Scanning interferometry for thin film thickness and surface measurements
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US Patent 7471397 Position-measuring device
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US Patent 7474407 Optical coherence tomography with 3d coherence scanning
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US Patent 7477362 Moiré interferometric strain sensor
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US Patent 7480059 Optical coherence tomography for eye-length measurement
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US Patent 7480060 Interferometric optical position encoder employing spatial filtering of diffraction orders for improved accuracy
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US Patent 7483142 Security systems and monitoring methods using quantum states
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US Patent 7483144 Apparatus and method for resonant chemical and biological sensing
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US Patent 7486404 Size difference measuring method and size difference measuring apparatus
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US Patent 7492462 Optochemical sensor
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US Patent 7492466 Optical image measuring apparatus and optical image measuring method
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US Patent 7492468 Free-form optical surface measuring apparatus and method
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US Patent 7495769 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry
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US Patent 7495772 Multi-cavity Fabry-Perot interferometric thin-film sensor with built-in temperature compensation
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US Patent 7495774 Optical air data system
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US Patent 7499176 Apparatus and method for using a counter-propagating signal method for locating events
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US Patent 7499177 Apparatus and method for using a counter-propagating signal method for locating events
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US Patent 7502120 Fiber optic interferometric sensor array
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US Patent 7502121 Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials
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US Patent 7502395 Pulsed coherent fiber array and method
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US Patent 7505145 Optical air data system
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US Patent 7508525 High efficiency balanced detection interferometer
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US Patent 7508526 Defect inspecting apparatus
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US Patent 7508528 Optical air data system
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US Patent 7511821 Device for improving the life of a triaxial gyro
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US Patent 7511826 Symmetrical illumination forming system and method
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US Patent 7515271 Wavelength calibration in a fiber optic gyroscope
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US Patent 7515272 Digital feedback systems and methods for optical gyroscopes
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US Patent 7515273 Method for measuring the brillouin shift distribution along an optical fiber based on the optical demodulation of the signals, and relevant apparatus
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US Patent 7515275 Optical apparatus and method for distance measuring
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US Patent 7518728 Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications
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US Patent 7518734 Apparatus and method of measuring thickness of lingual fur and acquiring vertical section image thereof
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US Patent 7518736 Optical air data system
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US Patent 7518737 Displacement-measuring optical device with orifice
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US Patent 7522283 Methods and apparatus for the improved measurement of circular and linear dichroism and uses thereof
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US Patent 7522291 Optical air data system
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US Patent 7525650 Substrate processing apparatus for performing photolithography
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US Patent 7525665 Polarising interferometer
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US Patent 7525666 Interferometric measuring device
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US Patent 7525669 High-speed, scanning phase-shifting profilometry using 2D CMOS sensor
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US Patent 7528961 Compensation of turbulent effects of gas in measurement paths of multi-axis interferometers
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US Patent 7532330 Angle interferometers
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US Patent 7534631 Apparatus for measuring semiconductor physical characteristics
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US Patent 7535557 Lens measuring method and device for determining decenter and tilt of the lens
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US Patent 7535572 Compression assembly of spatial heterodyne spectrometer (SHS)
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US Patent 7535574 Baseplate for a ring laser gyroscope
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US Patent 7535575 Plasma shunting apparatus and method for ring laser gyroscope
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US Patent 7535576 Integrated optical rotation sensor and method for sensing rotation rate
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US Patent 7535577 Optical mapping apparatus with optimized OCT configuration
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US Patent 7538872 Diagnostic methods and apparatus for directed energy applications
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US Patent 7538882 Systems and methods for assisting start of electrodeless RF discharge in a ring laser gyro
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US Patent 7538884 Optical tomographic imaging apparatus
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US Patent 7538885 Optical characteristic measuring apparatus
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US Patent 7538887 Temporal interferometric signal modeling with constant phase shift in white light interferometry
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US Patent 7538889 Calibration feedback-control circuit for diffraction light devices
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US Patent 7542145 Optical tomography method and optical tomography system
‌
US Patent 7545492 Sighting device and additional device for measuring, working, and/or operating with or without contact
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US Patent 7545506 Interferometric measuring device
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US Patent 7545508 Interferometric apparatus utilizing a cantilever array to measure a surface
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US Patent 7545513 Encoding optical cavity output light
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US Patent 7548320 Optical image measuring apparatus
‌
US Patent 7551293 Method and apparatus for three-dimensional spectrally encoded imaging
‌
US Patent 7554668 Light source for swept source optical coherence tomography based on cascaded distributed feedback lasers with engineered band gaps
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US Patent 7554671 Absolute position measurement apparatus
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US Patent 7557928 Apparatus using optical coherence tomography based on spectral interference, and an ophthalmic apparatus
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US Patent 7557929 Systems and methods for phase measurements
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US Patent 7557930 Bessel beam interferometer and measurement method
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US Patent 7561274 Optical spectroscopy utilizing planar spectral filters
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US Patent 7564550 Fluorescence polarization imaging devices and methods
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US Patent 7564559 MEMS-based, phase-shifting interferometer
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US Patent 7564565 Wavelength-tunable light generator and optical coherence tomography device
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US Patent 7570363 Measuring endoscope apparatus
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US Patent 7570364 Optical tomographic imaging apparatus
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US Patent 7570367 Optical interference apparatus
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US Patent 7573579 Coded aperture imaging photopolarimetry
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US Patent 7573581 Position-measuring device
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US Patent 7573582 Method for monitoring film thickness, a system for monitoring film thickness, a method for manufacturing a semiconductor device, and a program product for controlling film thickness monitoring system
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US Patent 7576840 Brillouin spectral measuring method and Brillouin spectral measuring apparatus
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US Patent 7576868 Cyclic error compensation in interferometry systems
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US Patent 7576870 Measurement apparatus, exposure apparatus, and device fabrication method
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US Patent 7583368 Method of enhancing measurement of stress in glass
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US Patent 7583384 High resolution IOC drive and method for driving fiber optic gyroscopes
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US Patent 7589841 Solid-state laser gyro with a mechanically activated gain medium
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US Patent 7593100 Measuring method, measuring system, inspecting method, inspecting system, exposure method and exposure system, in which information as to the degree of the flatness of an object is pre-obtained
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US Patent 7595888 Full-band optical spectrum analyzer and method
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US Patent 7595892 Multiple channel interferometric surface contour measurement system
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US Patent 7599070 Optical axis polarization type laser interferometer
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US Patent 7602504 Exposure apparatus and device manufacturing method
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US Patent 7605926 Optical system, method of manufacturing an optical system and method of manufacturing an optical element
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US Patent 7609386 Optical characteristic measuring apparatus
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US Patent 7609391 Optical lattice microscopy
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US Patent 7609978 Interferometric polarization control
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US Patent 7612886 Fiber-optic seismic sensor
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US Patent 7612887 Micro resonator sensor
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US Patent 7616320 Method and apparatus for recognition of microorganisms using holographic microscopy
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US Patent 7616322 Cyclic error compensation in interferometry systems
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US Patent 7616323 Interferometer with multiple modes of operation for determining characteristics of an object surface
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US Patent 7619744 Movement sensor
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US Patent 7619745 Optical encoder including aperture with diffusion element and collimator lens
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US Patent 7623245 Differential pressure measuring system and differential pressure measuring method
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US Patent 7623246 Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same
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US Patent 7626706 Polarization interference microscope
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US Patent 7626707 Dual cavity displacement sensor
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US Patent 7626708 Phase shifting grating-slit test for optical surface reconstruction
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US Patent 7626762 Jog zone free fiber optic coil
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US Patent 7630082 Systems and methods for high precision feedback control in closed loop sensors
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US Patent 7630083 Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
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US Patent 7633630 Image amplifying, servo-loop controlled, point diffraction interometer
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US Patent 7633631 Three-dimensional microscope and method for obtaining three-dimensional image
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US Patent 7636151 System and method for providing residual stress test structures
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US Patent 7643148 Apparatus and method for the detection of molecules
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US Patent 7643149 Method of aligning an optical system
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US Patent 7643152 Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
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US Patent 7643153 Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
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US Patent 7646489 Apparatus and method for measuring film thickness
‌
US Patent 7646490 Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase shifting point-diffraction interferometry
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US Patent 7654685 Variable-wavelength illumination system for interferometry
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US Patent 7663765 Refractive-index measurement system and method for measuring refractive-index
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US Patent 7679753 Passively biased fiber-optic gyroscope and current sensor
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US Patent 7684048 Scanning microscopy
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US Patent 7692796 Optical characteristic measuring apparatus
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US Patent 7697121 Sensing system having wavelength reflectors that receive modulated light signals
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US Patent 7697146 Apparatus and method for optical interference fringe based integrated circuit processing
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US Patent 7701583 Coherence spectrometry devices
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US Patent 7701585 Optical tomograph which obtains tomographic images irrespective of polarization direction of light beams
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US Patent 7701589 Three-dimensional shape measuring method and apparatus
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US Patent 7705991 Gas concentration measuring apparatus
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US Patent 7705992 Optical coherence tomography system
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US Patent 7715014 Methods and systems for fiber optic gyroscopes vibration error suppression
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US Patent 7719688 Optical device and method of making the same
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US Patent 7728958 Condition assessment method for a structure including a semiconductor material
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US Patent 7728964 Motion compensated light-emitting apparatus
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US Patent 7728983 Diffraction grating based interferometric systems and methods
‌
US Patent 7728986 Systems and methods for digital detection of a tomographic signal
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US Patent 7733492 Sagnac fourier transform spectrometer having improved resolution
‌
US Patent 7738109 Fiber optic sensor using a Bragg fiber
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US Patent 7742172 Apparatus for varying the path length of a beam of radiation
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US Patent 7742174 Methods, systems and computer program products for removing undesired artifacts in fourier domain optical coherence tomography (FDOCT) systems using continuous phase modulation and related phase modulators
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US Patent 7746476 Fiber optic gyroscope
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US Patent 7751058 Optical rotation counter
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US Patent 7751059 Method for correcting disturbances in a level sensor light path
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US Patent 7751061 Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer
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US Patent 7751063 Multiple channel interferometric surface contour measurement system
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US Patent 7764383 Adaptively determining the sign in a fringe count detection system
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US Patent 7764385 Fine alignment of a large segmented mirror
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US Patent 7768649 System and method for ultrafast optical signal detecting via a synchronously coupled anamorphic light pulse encoded laterally
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US Patent 7773230 Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material
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US Patent 7773231 Differential pressure measuring system and differential pressure measuring method
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US Patent 7777889 Bias-instability reduction in fiber optic gyroscopes
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US Patent 7777890 Method and power-assisted optic-fiber measuring device and gyro
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US Patent 7777891 Elasticity and viscosity measuring apparatus
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US Patent 7777895 Linear-carrier phase-mask interferometer
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US Patent 7782463 Particle density measuring probe and particle density measuring equipment
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US Patent 7782466 Method and apparatus for resonant frequency identification through out-of-plane displacement detection
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US Patent 7782468 Method and device for measuring heights of patterns
‌
US Patent RE41633 Light source for swept source optical coherence tomography based on cascaded distributed feedback lasers with engineered band gaps
‌
US Patent 7791733 Semiconductor ring laser gyro
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US Patent 7796244 Method for mapping of dispersion and other optical properties of optical waveguides
‌
US Patent 7796273 Phase-shifting interferometry in the presence of vibration
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US Patent 7796275 Phase-shifting interferometry in the presence of vibration using phase bias
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US Patent 7804600 Ring-laser gyroscope system using dispersive element(s)
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US Patent 7808618 Methods and apparatus for providing a semiconductor optical flexured mass accelerometer
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US Patent 7812962 Polarization mode dispersion measurement using an improved fixed analyzer method
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US Patent 7812968 Fringe projection system and method for a probe using a coherent fiber bundle
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US Patent 7817279 Sensing a disturbance
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US Patent 7817282 Use of crossed-beam spectral interferometry to characterize optical pulses
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US Patent 7817283 Determining electric field characteristics of laser pulses
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US Patent 7821647 Apparatus and method for measuring surface topography of an object
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US Patent 7821648 Measurement method, a measurement apparatus, and a computer-readable recording medium
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US Patent 7830527 Multiple frequency optical mixer and demultiplexer and apparatus for remote sensing
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US Patent 7835008 Gyro employing semiconductor laser
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US Patent 7835012 Alignment interferometer telescope apparatus and method
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US Patent 7847924 Performance of an atom interferometric device through complementary filtering
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US Patent 7847953 Homodyne laser interferometer probe and displacement measurement system using the same
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US Patent 7852484 Light control unit, optical tomographic imaging method and apparatus
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US Patent 7852485 Single trace multi-channel low coherence interferometric sensor
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US Patent 7852488 Method and device for characterising a structure by wavelength effect in a photoacoustic system
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US Patent 7855788 Spectroscopy method and spectroscope
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US Patent 7855791 Vibration-resistant interferometric scanning system and method thereof
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US Patent 7859679 System, method and arrangement which can use spectral encoding heterodyne interferometry techniques for imaging
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US Patent 7859683 Fast three-dimensional shape measuring apparatus and method
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US Patent 7864327 In-phase/in-quadrature demodulator for spectral information of interference signal
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US Patent 7864328 Determination of optimum modulation amplitude to suppress modulation-distortation-induced rotation sensing errors in a fiber optic gyroscope
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US Patent 7864333 Polarization modulated image conjugate piston sensing and phase retrieval system
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US Patent 7864334 Interferometric defect detection
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US Patent 7864338 Interferometric method and apparatus for linear detection of motion from a surface
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US Patent 7864339 Method for the contactless measurement of three-dimensional objects with two layers by single-view backlit shadowgraphy
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US Patent 7869052 Method and amplifying stage for suppressing modulation distortion rate sensing errors in a resonator fiber optic gyroscope
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US Patent 7869053 High temporal resolution optical sampler and sampling method
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US Patent 7869054 Polarization insensitive multiple probe
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US Patent 7869056 Linear displacement and tilting angle measuring device
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US Patent 7872740 Motion-compensated light-emitting apparatus
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US Patent 7872755 Interferometer
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US Patent 7872757 Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
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US Patent 7872762 Optical position measuring arrangement
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US Patent 7876445 Two-photon-absorption magneto-optic dispersion spectrometer
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US Patent 7876451 Position-measuring device with movable deflection device and grating and with stationary grating, light source, and detector
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US Patent 7880892 Optical tomographic imaging apparatus and optical tomographic imaging method
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US Patent 7880895 Optical tomographic image photographing apparatus
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US Patent 7880897 Light wave interferometer apparatus
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US Patent 7884944 Two-photon-absorption dispersion spectrometer
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US Patent 7889348 Arrangements and methods for facilitating photoluminescence imaging
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US Patent 7889352 Integrated polarization beam splitter with quarter-wave plate for polarimeter and PMD compensation applications
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US Patent 7889353 Method of measuring relative movement of an object and an optical input device over a range of speeds
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US Patent 7889354 Interferometric measuring device
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US Patent 7889356 Two grating lateral shearing wavefront sensor
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US Patent 7894073 Bias-instability reduction in fiber optic gyroscopes
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US Patent 7894074 Laser doppler vibrometer employing active frequency feedback
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US Patent 7898656 Apparatus and method for cross axis parallel spectroscopy
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US Patent 7903257 Apparatus and method for ranging and noise reduction of low coherence interferometry (LCI) and optical coherence tomography (OCT) signals by parallel detection of spectral bands
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US Patent 7903258 System and method for positioning a product using a laser interferometer
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US Patent 7903259 Device for determining the position of at least one structure on an object, use of an illumination apparatus with the device and use of protective gas with the device
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US Patent 7907263 Apparatuses and methods using measurement of a flare generated in an optical system
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US Patent 7907285 Scattered light measuring device
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US Patent 7907286 Optical position-measuring device
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US Patent 7916301 Filter design for colorimetric measurement
‌
US Patent 7916305 Surface reflection encoder scale and surface reflection encoder using the same
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US Patent 7920269 System and method for measuring interferences
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US Patent 7924426 Information processing apparatus for interference signal processing
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US Patent 7924427 Photonic crystal based rotation sensor
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US Patent 7924433 Displacement measurement system and method of use
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US Patent 7929120 Apparatus for controlling optical fringe generation member based on detected optical fringe and method therefor
‌
US Patent 7929146 Methods and systems for removing undesired artifacts in fourier domain optical coherence tomography (FDOCT) systems using continuous phase modulation and related phase modulators
‌
US Patent 7929147 Method and system for determining an optimized artificial impedance surface
‌
US Patent 7929150 Alignment interferometer telescope apparatus and method
‌
US Patent 7933020 System and method for reducing laser phase noise in a resonator fiber optic gyroscope
‌
US Patent 7936461 All-optical fiber interferometer
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US Patent 7940397 Optical connector and an optical tomographic imaging system using the same
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US Patent 7940399 Jones phase microscopy of transparent samples
‌
US Patent 7940400 Method and apparatus for continuous readout of fabry-perot fiber optic sensor
‌
US Patent 7944565 Semiconductor ring laser gyro
‌
US Patent 7944566 Single fiber endoscopic full-field optical coherence tomography (OCT) imaging probe
‌
US Patent 7948639 Phase-shifting interferometry in the presence of vibration
‌
US Patent 7952720 Apparatus and method for using a counter-propagating signal method for locating events
‌
US Patent 7952721 Optical linear and rotation displacement sensor
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US Patent 7952724 Interferometer with multiple modes of operation for determining characteristics of an object surface
‌
US Patent 7961332 Fiber-optic heterodyne imaging vibrometer
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US Patent 7961333 Method for scanning optical interference patterns with line sensors
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US Patent 7961334 Coordinate measuring machine for measuring structures on a substrate
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US Patent 7961335 Variable spectroscopy device
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US Patent 7969583 System and method to determine an object distance from a reference point to a point on the object surface
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US Patent 7973938 Bias-reduced fiber optic gyroscope with polarizing fibers
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US Patent 7978333 Holographic sensor having heterogeneous properties
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US Patent 7978334 Matter-wave rate gyro integrated onto an atom chip and associated Accelerometer
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US Patent 7978341 Multi-channel laser interferometric method and apparatus for detection of ultrasonic motion from a surface
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US Patent 7986413 Methods and apparatus for rapid scanning continuous wave terahertz spectroscopy and imaging
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US Patent 7990544 Microcontroller-based imaging system utilizing a CMOS image sensor array
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US Patent 7995208 Monolithic interferometer with optics of different material
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US Patent 7995210 Devices and arrangements for performing coherence range imaging using a common path interferometer
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US Patent 7995211 Contra-propagative wave spectograph
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US Patent 8004676 Method for detecting analytes using surface plasmon resonance
‌
US Patent 8004689 Method of assessing bond integrity in bonded structures
‌
US Patent 8004690 Device and method for the optical measurement of an optical system, measurement structure support, and microlithographic projection exposure apparatus
Edits on 8 Dec, 2021
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US Patent 8004689 Method of assessing bond integrity in bonded structures
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US Patent 8004676 Method for detecting analytes using surface plasmon resonance
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Patent primary examiner of
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US Patent 7995208 Monolithic interferometer with optics of different material
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US Patent 7995211 Contra-propagative wave spectograph
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US Patent 7990544 Microcontroller-based imaging system utilizing a CMOS image sensor array
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US Patent 7978334 Matter-wave rate gyro integrated onto an atom chip and associated Accelerometer
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US Patent 7978333 Holographic sensor having heterogeneous properties
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US Patent 7973938 Bias-reduced fiber optic gyroscope with polarizing fibers
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US Patent 7961335 Variable spectroscopy device
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US Patent 7961332 Fiber-optic heterodyne imaging vibrometer
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US Patent 7961334 Coordinate measuring machine for measuring structures on a substrate
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US Patent 7961333 Method for scanning optical interference patterns with line sensors
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US Patent 7952721 Optical linear and rotation displacement sensor

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