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US Patent 7663765 Refractive-index measurement system and method for measuring refractive-index

Patent 7663765 was granted and assigned to Hon Hai Precision Industry Co Ltd on February, 2010 by the United States Patent and Trademark Office.

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Patent
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Current Assignee
‌
Hon Hai Precision Industry Co Ltd
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7663765
Patent Inventor Names
Kun-I Yuan0
Date of Patent
February 16, 2010
Patent Application Number
12170741
Date Filed
July 10, 2008
Patent Primary Examiner
‌
Patrick J Connolly
Patent abstract

A refractive-index measurement system includes a light source, a first beam splitter, a first reflective mirror, a second reflective mirror, a second beam splitter, a container, a first polarizer, and a second polarizer. The first beam splitter splits light emitted from the light source into first and second light beams. The first light beam and the second light beam are reflected by the first reflective mirror and the second reflective mirror, respectively, incident into the second light beam splitter. The container is positioned along an optical pathway of first light beam. The container accommodates a lens and is filled with a medium having a refractive index substantially the same as a theoretical refractive index of the lens. The first polarizer is positioned along the optical pathway of the first light beam. The second polarizer is positioned along an optical pathway of the second light beam.

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