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Patrick Connolly

based in Florida

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Edits on 20 Aug, 2022
"Infobox creation from: https://twitter.com/pconnpie"
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Golden AI
edited on 20 Aug, 2022
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Location
Orlando, Florida
Orlando, Florida
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godwinno feliks
edited on 20 Aug, 2022
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Twitter URL
https://twitter.com/pconnpie
Edits on 11 Aug, 2022
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godwinno feliks
edited on 11 Aug, 2022
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Facebook URL
https://www.facebook.com/patrick.connolly.50702
Edits on 14 Dec, 2021
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Golden AI
edited on 14 Dec, 2021
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Patent primary examiner of
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US Patent 7253902 Wavelength detector
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US Patent 7259860 Optical feedback from mode-selective tuner
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US Patent 7277180 Optical connection for interferometry
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US Patent 7277181 Interferometric apparatus and method for surface profile detection
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US Patent 7280217 Interferometer utilizing a rotating rigid structure
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US Patent 7280223 Interferometry systems and methods of using interferometry systems
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US Patent 7283252 Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method
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US Patent 7286240 Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems
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US Patent 7286243 Beam profile complex reflectance system and method for thin film and critical dimension measurements
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US Patent 7286244 Analyzer
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US Patent 7289220 Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure
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US Patent 7289221 Mach Zehnder photonic crystal sensors and methods
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US Patent 7289226 Characterization and compensation of errors in multi-axis interferometry systems
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US Patent 7292343 Gas discharge MOPA laser spectral analysis module
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US Patent 7292344 Integrated spectroscopy system
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US Patent 7292345 Fibre-optic interferometric remote sensor
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US Patent 7292347 Dual laser high precision interferometer
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US Patent 7295327 Measuring apparatus and exposure apparatus having the same
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US Patent 7298489 Method and apparatus for characterizing the electric field of periodic and non-periodic optical signals
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US Patent 7304744 Apparatus and method for measuring the thickness of a thin film via the intensity of reflected light
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US Patent 7312863 Motion-compensating light-emitting apparatus
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US Patent 7312875 Two-wavelength spatial-heterodyne holography
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US Patent 7324205 Optical accelerometer, gravitometer, and gradiometer
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US Patent 7324208 Optical frequency measurement apparatus and optical frequency measurement method
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US Patent 7324210 Scanning interferometry for thin film thickness and surface measurements
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US Patent 7324212 Optical encoder having slanted optical detector elements for harmonic suppression
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US Patent 7324213 Small angle high frequency angular displacement measurement system
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US Patent 7324216 Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers
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US Patent 7327463 Low coherence interferometry utilizing magnitude
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US Patent 7327465 Compensation for effects of beam misalignments in interferometer metrology systems
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US Patent 7327466 Multi-corner retroreflector
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US Patent 7327467 Phase measuring method and apparatus for measuring characterization of optical thin films
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US Patent 7330266 Stationary fourier transform spectrometer
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US Patent 7330273 Compact high resolution imaging apparatus
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US Patent 7330274 Compensation for geometric effects of beam misalignments in plane mirror interferometers
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US Patent 7330276 Optical interference substrate, target detecting substrate, target detecting apparatus, and target detecting process
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US Patent 7333208 Full width array mechanically tunable spectrophotometer
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US Patent 7333211 Method for determining a qualitative characteristic of an interferometric component
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US Patent 7333214 Detector for interferometric distance measurement
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US Patent 7339678 Method and system of using odd harmonics for phase generated carrier homodyne
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US Patent 7339679 Interferometric measuring device utilizing a slanted probe filter
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US Patent 7339681 Surface plasmon resonance microscope using common-path phase-shift interferometry
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US Patent 7342666 Method and apparatus for measuring holding distortion
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US Patent 7342667 Method of processing an optical element using an interferometer having an aspherical lens that transforms a first spherical beam type into a second spherical beam type
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US Patent 7349100 Recording multiple spatially-heterodyned direct to digital holograms in one digital image
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US Patent 7349102 Methods and apparatus for reducing error in interferometric imaging measurements
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US Patent 7352469 Quantum resonance analytical instrument
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US Patent 7352470 Fourier transform spectrometry with a single-aperture interferometer
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US Patent 7352474 Interferometric optical tomography
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US Patent 7352476 Device for detecting atmospheric turbulence
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US Patent 7355714 Reconfigurable MEMS fabry-perot tunable matrix filter systems and methods
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US Patent 7355716 Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
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US Patent 7355722 Catoptric and catadioptric imaging systems with adaptive catoptric surfaces
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US Patent 7365855 Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same
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US Patent 7365856 Method of motion correction in optical coherence tomography imaging
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US Patent 7365857 Precompensation of polarization errors in heterodyne interferometry
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US Patent 7369250 System and method to inspect components having non-parallel surfaces
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US Patent 7369252 Process control monitors for interferometric modulators
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US Patent 7369253 Systems and methods for measuring sample surface flatness of continuously moving samples
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US Patent 7372575 Optical tomographic apparatus
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US Patent 7375817 Counting signal processing method for fiber optic interferometric sensor
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US Patent 7375819 System and method for generating beams of light using an anisotropic acousto-optic modulator
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US Patent 7375821 Profilometry through dispersive medium using collimated light with compensating optics
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US Patent 7375823 Interferometry systems and methods of using interferometry systems
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US Patent 7375825 Light intensity ratio adjustment filter for an interferometer, interferometer, and light interference measurement method
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US Patent 7379187 Detector configuration for interferometric distance measurement
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US Patent 7382451 Method of defect inspection
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US Patent 7382470 Interferometric measuring device
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US Patent 7385707 Surface profiling apparatus
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US Patent 7388672 High efficiency balanced detection interferometer
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US Patent 7388675 Interferometers for the measurement of large diameter thin wafers
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US Patent 7391519 Generation of spatially distributed spectral data using a multi-aperture system
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US Patent 7391521 Position detection apparatus and method
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US Patent 7394548 Heterodyne laser interferometer using heterogenous mode helium-neon laser and super heterodyne phase measuring method
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US Patent 7394550 Displacement detector
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US Patent 7397558 Ordered array of nanoparticles for efficient nanoenhanced Raman scattering detection and methods of forming the same
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US Patent 7400390 Inspection system and a method for aerial reticle inspection
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US Patent 7403288 Method and apparatus for measuring thickness of thin article
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US Patent 7405830 Vibration-insensitive interferometer
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US Patent 7405833 Method for calibration and removal of wavefront errors
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US Patent 7408631 Device for the range-resolved determination of scattered light, operating method, illumination mask and image-field mask
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US Patent 7411667 Method for correcting disturbances in a level sensor light path
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US Patent 7411686 Methods and apparatus for aligning an etalon with a photodiode array
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US Patent 7411687 Speckle reduction method and system for EUV interferometry
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US Patent 7412175 Interferometric polarization control
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US Patent 7423279 Systems and methods that detect changes in incident optical radiation
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US Patent 7423763 Faster processing of multiple spatially-heterodyned direct to digital holograms
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US Patent 7423765 Optical system of a microlithographic projection exposure apparatus
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US Patent 7426021 Interferometric optical analyzer and method for measuring the linear response of an optical component
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US Patent 7426036 Common path frequency domain optical coherence reflectometer and common path frequency domain optical coherence tomography device
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US Patent 7426040 Chip-scale optical spectrum analyzers with enhanced resolution
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US Patent 7428054 Micro-optical sensor system for pressure, acceleration, and pressure gradient measurements
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US Patent 7428055 Interferometer-based real time early fouling detection system and method
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US Patent 7428059 Measurement method and apparatus, exposure apparatus, and device manufacturing method
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US Patent 7440113 Littrow interferometer
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US Patent 7443513 Apparatus for optical measurement of an object
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US Patent 7446877 All-fiber spectroscopic optical sensor
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US Patent 7446878 Method and apparatus for improvement of spectrometer stability, and multivariate calibration transfer
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US Patent 7446882 Interferometer for determining characteristics of an object surface
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US Patent 7450239 Optical pulse evaluation device and in-service optical pulse evaluation device
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US Patent 7453584 Examining a structure formed on a semiconductor wafer using machine learning systems
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US Patent 7460225 Miniaturized source devices for optical and mass spectrometry
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US Patent 7474417 Method for estimating at least one component placement position on a substrate as well as a device for carrying out such a method
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US Patent 7755765 Method and apparatus for inertial sensing via measurement of trapped orbit dynamics
Edits on 5 Dec, 2021
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Golden AI
edited on 5 Dec, 2021
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Patent primary examiner of
‌
US Patent 7755765 Method and apparatus for inertial sensing via measurement of trapped orbit dynamics
Edits on 1 Dec, 2021
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Golden AI
edited on 1 Dec, 2021
Edits on 1 Dec, 2021
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7460225 Miniaturized source devices for optical and mass spectrometry
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7453584 Examining a structure formed on a semiconductor wafer using machine learning systems
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7450239 Optical pulse evaluation device and in-service optical pulse evaluation device
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7446882 Interferometer for determining characteristics of an object surface
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7446877 All-fiber spectroscopic optical sensor
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7443513 Apparatus for optical measurement of an object
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7440113 Littrow interferometer
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7428059 Measurement method and apparatus, exposure apparatus, and device manufacturing method
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7428055 Interferometer-based real time early fouling detection system and method
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7426040 Chip-scale optical spectrum analyzers with enhanced resolution
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021

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