Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
April 1, 2008
Patent Application Number
11066384
Date Filed
February 28, 2005
Patent Primary Examiner
Patent abstract
A spectrometer that implements the functionality of a Fizeau interferometer, the spectrometer including a collection device that is configured to collect a wavefront, a deformable mirror disposed at an image plane of the collection device, the deformable mirror having a plurality of sections, at least one of which is deformed to form interference patterns on the wavefront at the image plane, and a Fourier transformation module configured to derive spectral information from the interference patterns.
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