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Zygo Corporation

Zygo Corporation

Zygo Corporation is a global leader in the design, development, and production of high-precision metrology instruments, optical components, and assemblies.

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Edits on 14 Dec, 2023
"Infobox creation from: Wikidata data enrichment"
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Golden AI
approved a suggestion from Golden's AI on 14 Dec, 2023
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Infobox (+1 properties)
Infobox
Legal Entity Identifier
549300TN1CMM1XYVSA130
"NL fact extraction"
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Golden Au
edited on 14 Dec, 2023
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B2X
B2B
B2B
0
Founded Date
1970
0
Industry
Manufacturing
Manufacturing
0
Edits on 24 May, 2023
"Clean up website values by canonicalizing and removing duplicates"
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Golden AI
edited on 24 May, 2023
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Official Website
http://www.zygo.com/
Edits on 9 Sep, 2022
"prospector:1871:1361133"
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Katrina-Kay Pettitt
edited on 9 Sep, 2022
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Infobox (+1 properties)
Infobox
Industry
Photonics
Photonics
Edits on 14 Aug, 2022
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B.R WON
edited on 14 Aug, 2022
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Crunchbase URL
https://www.crunchbase.com/organization/zygo-corporation
Edits on 23 Jul, 2022
"remove invalid phone number value"
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Golden AI
edited on 23 Jul, 2022
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Phone number
86-21-64346150
"clean up phone number value"
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Golden AI
edited on 23 Jul, 2022
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Phone number
860-347-8506
Phone number
+18603478506
Edits on 22 Jul, 2022
"remove invalid phone number value"
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Golden AI
edited on 22 Jul, 2022
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Phone number
81-3-5812-6051
"clean up phone number value"
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Golden AI
edited on 22 Jul, 2022
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Phone number
65-6-842-4826
Phone number
+16568424826
Edits on 10 Jun, 2022
"Entity importer update"
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Golden AI
edited on 10 Jun, 2022
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Is a
Organization
Organization
Edits on 21 May, 2022
"Edit from table cell"
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Ирина Носкова
edited on 21 May, 2022
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Company Operating Status
Active
Edits on 8 Apr, 2022
"Patent autocalculation"
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Golden AI
edited on 8 Apr, 2022
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Patents assigned (count)
114
Edits on 13 Jan, 2022
"prospector:1066:434644"
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Amy Sar
edited on 13 Jan, 2022
Edits made to:
Infobox (+3 properties)
Infobox
Email address
inquire@zygo.com
Industry
Eyewear
Eyewear
Location
United States
United States
Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
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Infobox
Patents
‌
US Patent 7403289 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
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US Patent 7405833 Method for calibration and removal of wavefront errors
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US Patent 7417743 Interferometry systems and methods
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US Patent 7428057 Interferometer for determining characteristics of an object surface, including processing and calibration
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US Patent 7428685 Cyclic error compensation in interferometry systems
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US Patent 7433049 Multi-axis interferometer with procedure and data processing for mirror mapping
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US Patent 7446882 Interferometer for determining characteristics of an object surface
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US Patent 7446883 Method and apparatus for tilt corrected lateral shear in a lateral shear plus rotational shear absolute flat test
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US Patent 7456975 Methods and systems for interferometric analysis of surfaces and related applications
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US Patent 7466429 Profiling complex surface structures using scanning interferometry
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US Patent 7468799 Scanning interferometry for thin film thickness and surface measurements
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US Patent 7488929 Perimeter detection using fiber optic sensors
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US Patent 7489407 Error correction in interferometry systems
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US Patent 7492469 Interferometry systems and methods using spatial carrier fringes
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US Patent 7495770 Beam shear reduction in interferometry systems
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US Patent 7495773 In situ determination of pixel mapping in interferometry
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US Patent 7522288 Compensation of systematic effects in low coherence interferometry
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US Patent 7528961 Compensation of turbulent effects of gas in measurement paths of multi-axis interferometers
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US Patent 7528962 Apparatus and methods for reducing non-cyclic non-linear errors in interferometry
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US Patent 7532330 Angle interferometers
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US Patent 7542147 Data age compensation with avalanche photodiode
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US Patent 7548322 Multi-axis interferometers and methods and systems using multi-axis interferometers
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US Patent 7561278 Interferometer using integrated retarders to reduce physical volume
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US Patent 7564566 Method and system for analyzing low-coherence interferometry signals for information about thin film structures
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US Patent 7564568 Phase shifting interferometry with multiple accumulation
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US Patent 7576868 Cyclic error compensation in interferometry systems
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US Patent 7586620 Methods and systems for interferometric analysis of surfaces and related applications
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US Patent 7612893 Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts
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US Patent 7616322 Cyclic error compensation in interferometry systems
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US Patent 7616323 Interferometer with multiple modes of operation for determining characteristics of an object surface
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US Patent 7619746 Generating model signals for interferometry
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US Patent 7636166 Interferometer system for monitoring an object
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US Patent 7636168 Interferometry method and system including spectral decomposition
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US Patent 7639367 Interferometer system for monitoring an object
‌
US Patent 7684049 Interferometer and method for measuring characteristics of optically unresolved surface features
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US Patent 7697195 Apparatus for reducing wavefront errors in output beams of acousto-optic devices
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US Patent 7710580 Vibration resistant interferometry
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US Patent 7751064 Interference objective for annular test surfaces
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US Patent 7796273 Phase-shifting interferometry in the presence of vibration
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US Patent 7796275 Phase-shifting interferometry in the presence of vibration using phase bias
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US Patent 7812963 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
‌
US Patent 7812964 Distance measuring interferometer and encoder metrology systems for use in lithography tools
‌
US Patent 7812965 Multiple-degree of freedom interferometer with compensation for gas effects
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US Patent 7826063 Compensation of effects of atmospheric perturbations in optical metrology
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US Patent 7826064 Interferometer system for monitoring an object
‌
US Patent 7869057 Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis
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US Patent 7884947 Interferometry for determining characteristics of an object surface, with spatially coherent illumination
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US Patent 7889355 Interferometry for lateral metrology
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US Patent 7889356 Two grating lateral shearing wavefront sensor
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US Patent 7894075 Multiple-degree of freedom interferometer with compensation for gas effects
‌
US Patent 7924435 Apparatus and method for measuring characteristics of surface features
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US Patent 7933025 Sinusoidal phase shifting interferometry
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US Patent 7948636 Interferometer and method for measuring characteristics of optically unresolved surface features
‌
US Patent 7948637 Error compensation in phase shifting interferometry
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US Patent 7948638 Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts
‌
US Patent 7948639 Phase-shifting interferometry in the presence of vibration
‌
US Patent 7952724 Interferometer with multiple modes of operation for determining characteristics of an object surface
‌
US Patent 7978337 Interferometer utilizing polarization scanning
‌
US Patent 7978338 Compound reference interferometer
‌
US Patent 8004688 Scan error correction in low coherence scanning interferometry
Edits on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patents
‌
US Patent 7978337 Interferometer utilizing polarization scanning
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patents
‌
US Patent 7978338 Compound reference interferometer
Edits on 7 Dec, 2021
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Golden AI
edited on 7 Dec, 2021
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Golden AI
edited on 7 Dec, 2021
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Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patents
‌
US Patent 7948639 Phase-shifting interferometry in the presence of vibration

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