List of Nikon Metrology patents

Patents where

Current Assignee

Name

Nikon Metrology

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 9941090 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, and rotary vacuum seal	Patent 9941090 was granted and assigned to Nikon Metrology on April, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	9941090	April 10, 2018
‌ US Patent 8687173 Compact fiber optic geometry for a counter chirp FMCW coherent laser radar	Patent 8687173 was granted and assigned to Nikon Metrology on April, 2014 by the United States Patent and Trademark Office.		Nikon Metrology	United States Patent and Trademark Office	8687173	April 1, 2014
‌ US Patent 7986417 Laser projection systems and methods	Patent 7986417 was granted and assigned to Nikon Metrology on July, 2011 by the United States Patent and Trademark Office.		Nikon Metrology	United States Patent and Trademark Office	7986417	July 26, 2011
‌ US Patent 10119816 Low drift reference for laser radar	Patent 10119816 was granted and assigned to Nikon Metrology on November, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10119816	November 6, 2018
‌ US Patent 10478147 Calibration apparatus and method for computed tomography	Patent 10478147 was granted and assigned to Nikon Metrology on November, 2019 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10478147	November 19, 2019
‌ US Patent 10267629 Measurement probe unit for metrology applications	Patent 10267629 was granted and assigned to Nikon Metrology on April, 2019 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10267629	April 23, 2019
‌ US Patent 10365233 X-ray apparatus	Patent 10365233 was granted and assigned to Nikon Metrology on July, 2019 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10365233	July 30, 2019
‌ US Patent 10989879 Thermally compensated fiber interferometer assembly	Patent 10989879 was granted and assigned to Nikon Metrology on April, 2021 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10989879	April 27, 2021
‌ US Patent 10571409 X-ray apparatus	Patent 10571409 was granted and assigned to Nikon Metrology on February, 2020 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10571409	February 25, 2020
‌ US Patent 10166076 Registration object, correction method and apparatus for computed radiographic tomography	Patent 10166076 was granted and assigned to Nikon Metrology on January, 2019 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10166076	January 1, 2019
‌ US Patent 10283228 X-ray beam collimator	Patent 10283228 was granted and assigned to Nikon Metrology on May, 2019 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10283228	May 7, 2019
‌ US Patent 9947501 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal	Patent 9947501 was granted and assigned to Nikon Metrology on April, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	9947501	April 17, 2018
‌ US Patent 7925134 Precision length standard for coherent laser radar	Patent 7925134 was granted and assigned to Nikon Metrology on April, 2011 by the United States Patent and Trademark Office.		Nikon Metrology	United States Patent and Trademark Office	7925134	April 12, 2011
‌ US Patent 7876457 Laser metrology system and method	Patent 7876457 was granted and assigned to Nikon Metrology on January, 2011 by the United States Patent and Trademark Office.		Nikon Metrology	United States Patent and Trademark Office	7876457	January 25, 2011
‌ US Patent 8782878 Fastener automation system	Patent 8782878 was granted and assigned to Nikon Metrology on July, 2014 by the United States Patent and Trademark Office.		Nikon Metrology	United States Patent and Trademark Office	8782878	July 22, 2014
‌ US Patent 10856398 High voltage generator		Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10856398	December 1, 2020
‌ US Patent 10102997 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal	Patent 10102997 was granted and assigned to Nikon Metrology on October, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10102997	October 16, 2018
‌ US Patent 9966217 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal	Patent 9966217 was granted and assigned to Nikon Metrology on May, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	9966217	May 8, 2018
‌ US Patent 10096446 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal	Patent 10096446 was granted and assigned to Nikon Metrology on October, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10096446	October 9, 2018
‌ US Patent 10008357 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal	Patent 10008357 was granted and assigned to Nikon Metrology on June, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10008357	June 26, 2018
‌ US Patent 10020157 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal	Patent 10020157 was granted and assigned to Nikon Metrology on July, 2018 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10020157	July 10, 2018
‌ US Patent 10571410 X-ray apparatus	Patent 10571410 was granted and assigned to Nikon Metrology on February, 2020 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10571410	February 25, 2020
‌ US Patent 11680794 Low drift reference for laser radar		Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	11680794	June 20, 2023
‌ US Patent 10614990 Target assembly for an x-ray emission apparatus and x-ray emission apparatus	Patent 10614990 was granted and assigned to Nikon Metrology on April, 2020 by the United States Patent and Trademark Office.	Nikon Metrology	Nikon Metrology	United States Patent and Trademark Office	10614990	April 7, 2020

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