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US Patent 9472618 Nanowire field effect transistor device having a replacement gate

Patent 9472618 was granted and assigned to Taiwan Semiconductor Manufacturing Company on October, 2016 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
94726180
Patent Inventor Names
Richard Kenneth Oxland0
Date of Patent
October 18, 2016
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Patent Application Number
148218840
Date Filed
August 10, 2015
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Patent Citations Received
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US Patent 12132118 Semiconductor device having a multilayer source/drain region and methods of manufacture
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US Patent 12119404 Gate all around structure with additional silicon layer and method for forming the same
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US Patent 12125848 Semiconductor device structure incorporating air gap
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US Patent 12132092 Backside vias in semiconductor device
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US Patent 12132115 Semiconductor device structure with dielectric stressor
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US Patent 11658245 Semiconductor device and method of manufacturing
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US Patent 11664454 Method for forming semiconductor device structure
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US Patent 11664378 Semiconductor device structure and methods of forming the same
0
...
Patent Primary Examiner
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Michael Jung
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Patent abstract

One embodiment of the instant disclosure provides a transistor device that comprises: a semiconductor substrate; a buffer layer formed in a fin structure over the semiconductor substrate; a nanowire formed over the buffer layer, having at least a middle portion suspended over the buffer layer by an undercutting, the nanowire including a source and a drain region respectively defined at distal portions thereof and a channel region defined in the suspended portion of the nanowire and connecting the source and drain regions; and a gate structure surrounding at least a portion of the suspended portion of the nanowire.

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