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US Patent 11664378 Semiconductor device structure and methods of forming the same

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Is a
Patent
Patent
0

Patent attributes

Patent Applicant
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116643780
Date of Patent
May 30, 2023
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Patent Application Number
172259070
Date Filed
April 8, 2021
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Patent Citations
‌
US Patent 9576814 Method of spacer patterning to form a target integrated circuit pattern
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US Patent 9412817 Silicide regions in vertical gate all around (VGAA) devices and methods of forming same
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US Patent 9412828 Aligned gate-all-around structure
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US Patent 9472618 Nanowire field effect transistor device having a replacement gate
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US Patent 9502265 Vertical gate all around (VGAA) transistors and methods of forming the same
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US Patent 9608116 FINFETs with wrap-around silicide and method forming the same
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Patent Primary Examiner
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Theresa T Doan
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CPC Code
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H01L 29/41791
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H01L 27/0924
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H01L 29/7851
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H01L 29/66795
0
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H01L 21/823431
0

A semiconductor device structure, along with methods of forming such, are described. The structure includes a semiconductor fin having a first portion having a first width and a second portion having a second width substantially less than the first width. The first portion has a first surface, the second portion has a second surface, and the first and second surfaces are connected by a third surface. The third surface forms an angle with respect to the second surface, and the angle ranges from about 90 degrees to about 130 degrees. The structure further includes a gate electrode layer disposed over the semiconductor fin and source/drain epitaxial features disposed on the semiconductor fin on opposite sides of the gate electrode layer.

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