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List of Advanced Inquiry Systems Inc. patents

Patents where

Current Assignee

Name

‌

Advanced Inquiry Systems Inc.

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7456643 Methods for multi-modal wafer testing using edge-extended wafer translator	Patent 7456643 was granted and assigned to Advanced Inquiry Systems Inc. on November, 2008 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7456643	November 25, 2008
‌ US Patent 7532022 Apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate	Patent 7532022 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2009 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7532022	May 12, 2009
‌ US Patent 7489148 Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator	Patent 7489148 was granted and assigned to Advanced Inquiry Systems Inc. on February, 2009 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7489148	February 10, 2009
‌ US Patent 7579852 Wafer translator having metallization pattern providing high density interdigitated contact pads for component	Patent 7579852 was granted and assigned to Advanced Inquiry Systems Inc. on August, 2009 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7579852	August 25, 2009
‌ US Patent 8405414 Wafer testing systems and associated methods of use and manufacture	Patent 8405414 was granted and assigned to Advanced Inquiry Systems Inc. on March, 2013 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8405414	March 26, 2013
‌ US Patent 7786724 Methods and apparatus for collecting process characterization data after first failure in a group of tested devices	Patent 7786724 was granted and assigned to Advanced Inquiry Systems Inc. on August, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7786724	August 31, 2010
‌ US Patent 7723980 Fully tested wafers having bond pads undamaged by probing and applications thereof	Patent 7723980 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7723980	May 25, 2010
‌ US Patent 8889526 Apparatus for thinning, testing and singulating a semiconductor wafer	Patent 8889526 was granted and assigned to Advanced Inquiry Systems Inc. on November, 2014 by the United States Patent and Trademark Office.	‌ Advanced Inquiry Systems Inc.	‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8889526	November 18, 2014
‌ US Patent 8779789 Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods	Patent 8779789 was granted and assigned to Advanced Inquiry Systems Inc. on July, 2014 by the United States Patent and Trademark Office.	‌ Advanced Inquiry Systems Inc.	‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8779789	July 15, 2014
‌ US Patent 7719298 Full-wafer test and burn-in mechanism	Patent 7719298 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7719298	May 18, 2010
‌ US Patent 8704544 Method and apparatus for multi-planar edge-extended wafer translator	Patent 8704544 was granted and assigned to Advanced Inquiry Systems Inc. on April, 2014 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8704544	April 22, 2014
‌ US Patent 7724008 Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate	Patent 7724008 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7724008	May 25, 2010
‌ US Patent 8697456 Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereon	Patent 8697456 was granted and assigned to Advanced Inquiry Systems Inc. on April, 2014 by the United States Patent and Trademark Office.	‌ Advanced Inquiry Systems Inc.	‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8697456	April 15, 2014
‌ US Patent 7791174 Wafer translator having a silicon core isolated from signal paths by a ground plane	Patent 7791174 was granted and assigned to Advanced Inquiry Systems Inc. on September, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7791174	September 7, 2010
‌ US Patent 7786745 Method and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate	Patent 7786745 was granted and assigned to Advanced Inquiry Systems Inc. on August, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7786745	August 31, 2010
‌ US Patent 7453277 Apparatus for full-wafer test and burn-in mechanism	Patent 7453277 was granted and assigned to Advanced Inquiry Systems Inc. on November, 2008 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7453277	November 18, 2008
‌ US Patent 7724018 Methods and apparatus for translated wafer stand-in tester	Patent 7724018 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2010 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7724018	May 25, 2010
‌ US Patent 7379641 Fiber-based optical alignment system	Patent 7379641 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2008 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7379641	May 27, 2008
‌ US Patent 7572132 Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrate	Patent 7572132 was granted and assigned to Advanced Inquiry Systems Inc. on August, 2009 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7572132	August 11, 2009
‌ US Patent 7638366 Methods and apparatus for addition of electrical conductors to previously fabricated device	Patent 7638366 was granted and assigned to Advanced Inquiry Systems Inc. on December, 2009 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7638366	December 29, 2009
‌ US Patent 8076216 Methods and apparatus for thinning, testing and singulating a semiconductor wafer	Patent 8076216 was granted and assigned to Advanced Inquiry Systems Inc. on December, 2011 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8076216	December 13, 2011
‌ US Patent 7459924 Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasket	Patent 7459924 was granted and assigned to Advanced Inquiry Systems Inc. on December, 2008 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7459924	December 2, 2008
‌ US Patent 8872533 Wafer testing system and associated methods of use and manufacture	Patent 8872533 was granted and assigned to Advanced Inquiry Systems Inc. on October, 2014 by the United States Patent and Trademark Office.	‌ Advanced Inquiry Systems Inc.	‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8872533	October 28, 2014
‌ US Patent 7532021 Apparatus for translated wafer stand-in tester	Patent 7532021 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2009 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	7532021	May 12, 2009
‌ US Patent 8362797 Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetween	Patent 8362797 was granted and assigned to Advanced Inquiry Systems Inc. on January, 2013 by the United States Patent and Trademark Office.		‌ Advanced Inquiry Systems Inc.	United States Patent and Trademark Office	8362797	January 29, 2013

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