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US Patent 7453277 Apparatus for full-wafer test and burn-in mechanism

Patent 7453277 was granted and assigned to Advanced Inquiry Systems Inc. on November, 2008 by the United States Patent and Trademark Office.

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Current Assignee
‌
Advanced Inquiry Systems Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7453277
Date of Patent
November 18, 2008
Patent Application Number
11810950
Date Filed
June 6, 2007
Patent Primary Examiner
‌
Paresh Patel
Patent abstract

Assemblies include a substrate, such as a printed circuit board, with a first array of contact pads disposed thereon; a guide ring structure disposed on the substrate and at least partially surrounding the first array of contact pads; a translator socket disposed on the first array of contact pads, the translator socket adapted to receive the tester side of a translated wafer; a thermally conductive, conformal, heat spreading cushion adapted to be disposed over the backside of a wafer; a cover plate adapted to fit over the first array of contact pads, align with the guide ring structure, contain within it the various components disposed over the first array of contact pads, and removably attach to the substrate; and a bolster plate adapted to removably attach to a second side of the substrate. In a further aspect a translated wafer is disposed over the translator socket such that the tester side of the translator is in contact with the translator socket; and the heat spreading cushion is disposed over the backside of the translated wafer. In a still further aspect, the substrate includes signal communication means, such as but not limited to, an edge connector adapted to couple to various controller circuits, which are typically disposed on a printed circuit board.

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