Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
May 12, 2009
Patent Application Number
11810951
Date Filed
June 6, 2007
Patent Primary Examiner
Patent abstract
A translated wafer stand-in tester (TWST), being a hybrid apparatus capable of emulating the form factor and some or all behaviors of a translated wafer under test, which is operable to store, quantify, encode and convey, either directly or remotely, data from a testing system, including but not limited to pad pressure, electrical contact and temperature. The TWST may include several stacked and attached layers, at least one internal layer including electronic components operable to interact with a test system.
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