US Patent 7532021 Apparatus for translated wafer stand-in tester
Patent 7532021 was granted and assigned to Advanced Inquiry Systems Inc. on May, 2009 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
June 6, 2007
Date of Patent
May 12, 2009
Patent Application Number
11810951
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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