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US Patent 11656273 High current device testing apparatus and systems

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
November 5, 2021
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Date of Patent
May 23, 2023
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Patent Application Number
17520202
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Patent Citations
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US Patent 7355428 Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing
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US Patent 7436059 Thermoelectric cooling device arrays
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US Patent 7519880 Burn-in using system-level test hardware
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US Patent 7659738 Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same
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US Patent 7726145 Temperature control unit for electronic component and handler apparatus
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US Patent 7755899 Miniaturized high conductivity thermal/electrical switch
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US Patent 7781883 Electronic package with a thermal interposer and method of manufacturing the same
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US Patent 8552540 Wafer level package with thermal pad for higher power dissipation
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US Patent 8558540 Method of measuring dimensionless coupling constant of magnetic structure
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US Patent 8772682 Methods and apparatus for controlling temperature of a multi-zone heater in a process chamber
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•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11656273
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Patent Primary Examiner
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Tung X Nguyen
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CPC Code
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G01R 31/2874
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G01R 31/2875
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G01R 31/2877
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