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US Patent 11841440 Lidar system with high-resolution scan pattern

Patent 11841440 was granted and assigned to Luminar Technologies on December, 2023 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Current Assignee
Luminar Technologies
Luminar Technologies
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Date Filed
November 24, 2021
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Date of Patent
December 12, 2023
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Patent Applicant
Luminar Technologies
Luminar Technologies
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Patent Application Number
17535174
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Patent Citations
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US Patent 9869754 Scan patterns for lidar systems
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US Patent 9874629 Distance measurement device, receiver thereof and method of distance measurement
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US Patent 10131446 Addressing multiple time around (MTA) ambiguities, particularly for lidar systems, and particularly for autonomous aircraft
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US Patent 10267898 Scan patterns for lidar systems
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US Patent 10345437 Detecting distortion using other sensors
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US Patent 10802120 Coherent pulsed lidar system
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US Patent 11194048 Lidar system with high-resolution scan pattern
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US Patent 11415676 Interlaced scan patterns for lidar system
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US Patent 11353559 Adjustable scan patterns for lidar system
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US Patent 9292913 Augmented three dimensional point collection of vertical structures
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•••
Patent Inventor Names
Dmytro Trofymov
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Jason Paul Wojack
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Matthew D. Weed
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Istvan Peter Burbank
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Jason M. Eichenholz
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11841440
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Patent Primary Examiner
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Tyler D Paige
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