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US Patent 11353559 Adjustable scan patterns for lidar system

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
113535590
Patent Inventor Names
Matthew D. Weed0
Austin K. Russell0
Scott R. Campbell0
Jason M. Eichenholz0
Lane A. Martin0
Date of Patent
June 7, 2022
0
Patent Application Number
161552430
Date Filed
October 9, 2018
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Patent Citations
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US Patent 10802120 Coherent pulsed lidar system
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US Patent 10131446 Addressing multiple time around (MTA) ambiguities, particularly for lidar systems, and particularly for autonomous aircraft
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US Patent 10345437 Detecting distortion using other sensors
Patent Citations Received
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US Patent 11480660 Arrayed MEMS mirrors for large aperture applications
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US Patent 11555895 Dynamic compensation to polygon and motor tolerance using galvo control profile
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US Patent 11606540 System, method and computer program product for laser projection
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US Patent 11995157 Intelligent LiDAR scanning
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US Patent 11841440 Lidar system with high-resolution scan pattern
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Patent Primary Examiner
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Yuqing Xiao
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CPC Code
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G01S 7/497
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G01S 17/08
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G01S 17/10
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G01S 17/931
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G01S 7/4802
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G01S 7/4808
0
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G01S 7/4865
0
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G01S 17/894
0
...

In one embodiment, a lidar system includes a light source configured to emit pulses of light and a scanner configured to scan at least a portion of the emitted pulses of light along a scan pattern contained within an adjustable field of regard. The scanner includes a first scanning mirror configured to scan the portion of the emitted pulses of light substantially parallel to a first scan axis to produce multiple scan lines of the scan pattern, where each scan line is oriented substantially parallel to the first scan axis. The scanner also includes a second scanning mirror configured to distribute the scan lines along a second scan axis that is substantially orthogonal to the first scan axis, where the scan lines are distributed within the adjustable field of regard according to an adjustable second-axis scan profile.

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