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US Patent 11714580 Dynamic background scan optimization in a memory sub-system

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Is a
Patent
Patent
1

Patent attributes

Patent Applicant
Micron Technology
Micron Technology
1
Current Assignee
Micron Technology
Micron Technology
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
117145801
Date of Patent
August 1, 2023
1
Patent Application Number
178656861
Date Filed
July 15, 2022
1
Patent Citations
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US Patent 9558850 Efficient calibration of a data eye for memory devices
1
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US Patent 9761308 Systems and methods for adaptive read level adjustment
1
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US Patent 10140040 Memory device with dynamic program-verify voltage calibration
1
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US Patent 10170195 Threshold voltage shifting at a lower bit error rate by intelligently performing dummy configuration reads
1
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US Patent 10379739 Data storage device read threshold adjustment according to environmental parameters
1
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US Patent 10388376 Method for managing the endurance of a non-volatile rewritable memory and device for programming such a memory
1
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US Patent 10452480 Memory device with dynamic processing level calibration
1
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US Patent 10521140 Memory device with dynamic program-verify voltage calibration
1
...
Patent Primary Examiner
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Edward J Dudek, Jr.
1
CPC Code
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G06F 3/0604
1
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G06F 3/0619
1
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G06F 3/0614
1
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G06F 12/0238
1

Aspects of the present disclosure are directed to performing varying frequency memory sub-system background scans using either or both a timer and an I/O event limit. This can be accomplished by identifying a background scan trigger event from one of multiple possible types of background scan trigger events, such as a timer expiration or reaching an event count limit. In response to the background scan trigger event, a background scan can be initiated on a memory portion. The background scan can produce results, such as CDF-based data. When a metric based on the results exceeds a background scan limit, a refresh relocation can be performed and logged. A metric can be generated based on the CDF-based data, obtained error recovery depth data, or refresh relocation event data. When the metric is above or below corresponding background scan thresholds, a background scan frequency can be adjusted.

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