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US Patent 11360399 Metrology sensor for position metrology
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Edits on 9 Oct, 2024
"update inverses"
Golden AI
edited on 9 Oct, 2024
Edits made to:
Infobox
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+1
properties)
Infobox
Patent Citations Received
US Patent 12111580 Optical metrology utilizing short-wave infrared wavelengths
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Edits on 25 Apr, 2023
"Entity importer update"
Golden AI
edited on 25 Apr, 2023
Infobox
Is a
Patent
0
Patent Jurisdiction
United States Patent and Trademark Office
0
Patent Number
11360399
0
Date of Patent
June 14, 2022
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Patent Application Number
17277353
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Date Filed
August 27, 2019
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Patent Citations
US Patent 10585363 Alignment system
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Patent Primary Examiner
Peter B. Kim
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CPC Code
G03F 7/7065
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G03F 7/70633
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G03F 7/70583
0
Edits on 31 Mar, 2023
"update citations for inverse infoboxes"
Golden AI
edited on 31 Mar, 2023
Infobox
Patent Citations
US Patent 10585363 Alignment system
0
Edits on 25 Sep, 2022
"Entity importer update"
Golden AI
edited on 25 Sep, 2022
Infobox
Is a
Patent
0
Patent Jurisdiction
United States Patent and Trademark Office
0
Patent Number
11360399
0
Date of Patent
June 14, 2022
0
Patent Application Number
17277353
0
Date Filed
August 27, 2019
0
Patent Citations
US Patent 10585363 Alignment system
0
Patent Primary Examiner
Peter B. Kim
0
CPC Code
G03F 7/7065
0
G03F 7/70633
0
G03F 7/70583
0
Edits on 16 Jun, 2022
"Created via: Entity Importer"
Golden AI
created this topic on 16 Jun, 2022
Edits made to:
Infobox
(
+11
properties)
Article
(
+33
characters)
US Patent 11360399 Metrology sensor for position metrology
Article
Disclosed is a metrology device (
Infobox
Is a
Patent
Patent jurisdiction
United States Patent and Trademark Office
Patent number
11360399
Date of patent
June 14, 2022
Patent application number
17277353
Date Filed
August 27, 2019
Patent citations
US Patent 10585363 Alignment system
Patent primary examiner
Peter B. Kim
CPC Code
G03F 7/7065
G03F 7/70633
G03F 7/70583
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