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US Patent 11354193 Memory device with dynamic processing level calibration

Patent 11354193 was granted and assigned to Micron Technology on June, 2022 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors

Is a

Patent

Current Assignee

Micron Technology

Date Filed

September 10, 2019

Date of Patent

June 7, 2022

Patent Applicant

Micron Technology

Patent Application Number

16566692

Patent Citations

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US Patent 10521140 Memory device with dynamic program-verify voltage calibration

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US Patent 10566063 Memory system with dynamic calibration using a trim management mechanism

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US Patent 10936205 Techniques for retention and read-disturb aware health binning

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US Patent 11176036 Endurance enhancement scheme using memory re-evaluation

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US Patent 10963327 Detecting error count deviations for non-volatile memory blocks for advanced non-volatile memory block management

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US Patent 10140040 Memory device with dynamic program-verify voltage calibration

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US Patent 10170195 Threshold voltage shifting at a lower bit error rate by intelligently performing dummy configuration reads

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US Patent 10379739 Data storage device read threshold adjustment according to environmental parameters

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US Patent 10388376 Method for managing the endurance of a non-volatile rewritable memory and device for programming such a memory

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US Patent 10452480 Memory device with dynamic processing level calibration

Patent Inventor Names

Larry J. Koudele

Bruce A. Liikanen

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

11354193

Patent Primary Examiner

CPC Code

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