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US Patent 11354193 Memory device with dynamic processing level calibration

Patent 11354193 was granted and assigned to Micron Technology on June, 2022 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Micron Technology
Micron Technology
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Current Assignee
Micron Technology
Micron Technology
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
113541930
Patent Inventor Names
Larry J. Koudele0
Bruce A. Liikanen0
Date of Patent
June 7, 2022
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Patent Application Number
165666920
Date Filed
September 10, 2019
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Patent Citations
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US Patent 10521140 Memory device with dynamic program-verify voltage calibration
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US Patent 10566063 Memory system with dynamic calibration using a trim management mechanism
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US Patent 10936205 Techniques for retention and read-disturb aware health binning
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US Patent 11176036 Endurance enhancement scheme using memory re-evaluation
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US Patent 10963327 Detecting error count deviations for non-volatile memory blocks for advanced non-volatile memory block management
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US Patent 10140040 Memory device with dynamic program-verify voltage calibration
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US Patent 10170195 Threshold voltage shifting at a lower bit error rate by intelligently performing dummy configuration reads
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US Patent 10379739 Data storage device read threshold adjustment according to environmental parameters
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Patent Primary Examiner
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Joseph D Manoskey
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CPC Code
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G06F 11/141
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G06F 11/1608
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G06F 2201/805
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G11C 16/26
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G11C 29/02
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G11C 29/028
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G11C 29/52
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G11C 2029/4402
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A system includes a memory array including a plurality of memory cells; and a processing device coupled to the memory array, the processing device configured to iteratively adjust an active processing level used to process data, wherein, for each iteration, the processing device is configured to: determine a first error rate corresponding to the active processing level, determine a second error rate based on using an offset processing level different than the active processing level, and incrementally adjust the active processing level based on a comparison of the first error rate and the second error rate.

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