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US Patent 10872765 Selective layer formation using deposition and removing
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Patent
Date Filed
April 30, 2019
Date of Patent
December 22, 2020
Patent Application Number
16399328
Patent Citations
US Patent 10014212 Selective deposition of metallic films
US Patent 10041166 Reaction chamber passivation and selective deposition of metallic films
US Patent 10049924 Selective formation of metallic films on metallic surfaces
US Patent 10115603 Removal of surface passivation
US Patent 10186420 Formation of silicon-containing thin films
US Patent 10157786 Selective formation of metallic films on metallic surfaces
US Patent 10428421 Selective deposition on metal or metallic surfaces relative to dielectric surfaces
US Patent 10546741 Selective growth method
US Patent 10480064 Reaction chamber passivation and selective deposition of metallic films
Patent Citations Received
US Patent 11446699 Vapor phase deposition of organic films
US Patent 11501966 Selective layer formation using deposition and removing
US Patent 11387107 Deposition of organic films
US Patent 11430656 Deposition of oxide thin films
US Patent 11501965 Plasma enhanced deposition processes for controlled formation of metal oxide thin films
US Patent 11804373 Selective layer formation using deposition and removing
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10872765
Patent Primary Examiner
Ratisha Mehta
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