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US Patent 10018576 Material detection and analysis using a dielectric waveguide

Patent 10018576 was granted and assigned to Texas Instruments on July, 2018 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Texas Instruments
Texas Instruments
Date Filed
December 30, 2014
Date of Patent
July 10, 2018
Patent Applicant
Texas Instruments
Texas Instruments
Patent Application Number
14586842
Patent Citations Received
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US Patent 12115583 Systems and methods for adhesive-based part retention features in additively manufactured structures
0
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US Patent 11504912 Selective end effector modular attachment device
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US Patent 12090551 Removal of supports, and other materials from surface, and within hollow 3D printed parts
0
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US Patent 12111638 Adaptive production system
0
‌
US Patent 11479015 Custom formed panels for transport structures and methods for assembling same
‌
US Patent 11224943 Variable beam geometry laser-based powder bed fusion
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US Patent 11529741 System and method for positioning one or more robotic apparatuses
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US Patent 10605285 Systems and methods for joining node and tube structures
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US Patent 11534828 Assembling structures comprising 3D printed components and standardized components utilizing adhesive circuits
‌
US Patent 11535322 Omni-positional adhesion device
•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10018576
Patent Primary Examiner
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Jermele M Hollington

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