US Patent 9534889 Wavelength-selectable coating thickness measurement apparatus
Patent 9534889 was granted and assigned to Electronics and Telecommunications Research Institute on January, 2017 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
October 3, 2014
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Date of Patent
January 3, 2017
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Patent Applicant
Patent Application Number
14505747
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Patent Citations Received
Patent Inventor Names
Eun Kyoung Jeon
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Kwon Seob Lim
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Young Soon Heo
0
Young Sun Kim
0
Hyoung Jun Park
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Hyun Seo Kang
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Jeong Eun Kim
0
Keo Sik Kim
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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