US Patent 9534889 Wavelength-selectable coating thickness measurement apparatus

Patent 9534889 was granted and assigned to Electronics and Telecommunications Research Institute on January, 2017 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Patent Applicant

Electronics and Telecommunications Research Institute

Current Assignee

Electronics and Telecommunications Research Institute

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

95348890

Patent Inventor Names

Eun Kyoung Jeon0

Kwon Seob Lim0

Young Soon Heo0

Young Sun Kim0

Hyoung Jun Park0

Hyun Seo Kang0

Jeong Eun Kim0

Keo Sik Kim0

Date of Patent

January 3, 2017

Patent Application Number

145057470

Date Filed

October 3, 2014

Patent Citations Received

‌

US Patent 11927548 Mechanical components with radiographic markers

Patent Primary Examiner

‌

Jonathan Hansen

Patent abstract

Provided is an apparatus that measures a thickness of a coating by selecting a wavelength of a laser based on a color of the coating using a contactless method using a photoacoustic effect and an interferometer, the apparatus including a pulsed laser source to irradiate a pulsed laser beam toward the coating, a continuous wave (CW) laser source to irradiate a CW laser beam toward the coating, a detector to detect an optical interference signal corresponding to the CW laser beam, and a signal processor to process the optical interference signal to calculate a thickness of the coating.