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US Patent 8724100 Wafer level testing of optical devices

Patent 8724100 was granted and assigned to Kotura, Inc. on May, 2014 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Current Assignee
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Kotura, Inc.
Date Filed
October 22, 2012
Date of Patent
May 13, 2014
Patent Application Number
13694047
Patent Citations Received
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US Patent 12089931 Optical sensor for skin-contact detection and physiological parameter measurement at wearable electronic device
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US Patent 11852865 Optical system with phase shifting elements
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US Patent 11881678 Photonics assembly with a photonics die stack
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US Patent 11906778 Achromatic light splitting device with a high V number and a low V number waveguide
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US Patent 12066702 Systems and methods for distinguishing between a user and an object
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US Patent 11713999 Connected epitaxial optical sensing system comprising a trench deeper than a waveguide of a light source electrically isolates the light source and a detector
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US Patent 11777279 Laser architectures using quantum well intermixing techniques
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US Patent 11788929 Techniques for wafer level die testing using sacrificial structures
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US Patent 11835836 Mach-Zehnder interferometer device for wavelength locking
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US Patent 11852318 Optical system for noise mitigation
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Patent Inventor Names
Dazeng Feng
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Mehdi Asghari
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8724100
Patent Primary Examiner
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Tarifur Chowdhury

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