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US Patent 8250417 Method for detecting flash program failures

Patent 8250417 was granted and assigned to Micron Technology on August, 2012 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Micron Technology
Micron Technology
Date Filed
January 14, 2009
Date of Patent
August 21, 2012
Patent Application Number
12353878
Patent Citations Received
‌
US Patent 11670342 Recovery of memory from asynchronous power loss
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‌
US Patent 11776590 On-the-fly programming and verifying method for memory cells based on counters and ECC feedback
Patent Inventor Names
Samuel A. Shapero
0
Wanmo Wong
0
Brady Keays
0
Peter S. Feeley
0
Theodore T. Pekny
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8250417
Patent Primary Examiner
‌
Phung M Chung

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