US Patent 8214694 Lightweight probe and data collection within an integrated circuit

A system for monitoring a device under test implemented within an integrated circuit (IC) can include at least one probe that detects a designated type of data transaction, where in response to detecting the designated type of data transaction, each probe outputs a single data transaction detection signal. The system also can include a data collector coupled to each probe, where the data collector stores an indication of each data transaction detection signal that is output by each probe. The data collector can be configured so that no value of any probed signal is stored.