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US Patent 8194240 Enhanced focusing capability on a sample using a spot matrix

Patent 8194240 was granted and assigned to KLA-Tencor on June, 2012 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
KLA-Tencor
KLA-Tencor
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
81942400
Patent Inventor Names
Stan Stokowski0
Guoheng Zhao0
Mehdi Vaez-Iravani0
Date of Patent
June 5, 2012
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Patent Application Number
120422580
Date Filed
March 4, 2008
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Patent Citations Received
‌
US Patent 11703460 Methods and systems for optical surface defect material characterization
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Patent Primary Examiner
‌
Sang Nguyen
0
Patent abstract

A plurality of spots forming an M×N matrix can be used in a focus system. Specifically, a plurality of identical spots can be simultaneously projected onto the sample. A V(z) curve can be generated for each spot. A robust focus can be determined based on the generated V(z) curves. Using the spot matrix significantly increases the probability that at least one of the plurality of spots in the matrix can provide an unambiguous V(z) curve. Thus, the spot matrix eliminates the need to search for an appropriate site because the spot matrix increases the probability of landing on a “good” location by a factor of M×N.

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