US Patent 7834992 Method and its apparatus for detecting defects
Patent 7834992 was granted and assigned to Hitachi on November, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
April 3, 2007
0
Date of Patent
November 16, 2010
0
Patent Application Number
11695743
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Patent Inventor Names
Shunji Maeda
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Minoru Yoshida
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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