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US Patent 7834992 Method and its apparatus for detecting defects

Patent 7834992 was granted and assigned to Hitachi on November, 2010 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
Hitachi
Hitachi
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
78349921
Patent Inventor Names
Shunji Maeda1
Minoru Yoshida1
Date of Patent
November 16, 2010
1
Patent Application Number
116957431
Date Filed
April 3, 2007
1
Patent Primary Examiner
‌
Tarifur Chowdhury
1
Patent abstract

In the present invention, to make corrective matching thereof, it is designed as follows; position effect of defects coordinates, which are output from an inspection apparatus, is allowed, coordinates of inspected data are mutually corrected, and a state of coincidence or non-coincidence among a plurality sets of inspected data is output or displayed. Inspection data is designed to include kinds, kinds difference and dimension of defects. A state of coincidence or non-coincidence between inspected data is designed to be output or displayed appropriately, by kinds or dimensions, or by a grouping thereof, of a defects object. The same sample is inspected by every time of passing a production step, and a state of data increase or decrease, or coincidence or non-coincidence between the inspected data is designed to be output or displayed.

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