Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Wayne C. Goeke0
Date of Patent
November 16, 2010
0Patent Application Number
117594870
Date Filed
June 7, 2007
0Patent Primary Examiner
Patent abstract
A method for calibrating an impedance/admittance meter for measurements of a DUT includes measuring a pure capacitance at a desired frequency; using the capacitance measurement to establish the phase response of the meter; measuring the admittance value of a resistor with the meter at the desired frequency, the resistor having a known DC conductance and being known to primarily exhibit parallel capacitive frequency dependency; and adjusting the gain of the meter to provide the known DC conductance as the real component of the admittance value.
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