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US Patent 7769548 Microarray analytical data stitching system and method

Patent 7769548 was granted and assigned to Illumina on August, 2010 by the United States Patent and Trademark Office.

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Current Assignee
Illumina
Illumina
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
77695480
Patent Inventor Names
Francisco Jose Garcia0
Date of Patent
August 3, 2010
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Patent Application Number
118015350
Date Filed
May 10, 2007
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Patent Citations Received
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US Patent 12060608 Sequencing and high resolution imaging
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US Patent 11835460 System and method with fiducials having offset layouts
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US Patent 11995828 Densley-packed analyte layers and detection methods
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Patent Primary Examiner
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John S. Brusca
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Patent abstract

A technique is provided for analyzing image data for biological microarrays. Images are made of multiple swaths in multiple passes of an imaging system. Sites encoded by the image data are assigned a value and these values are indexed by site location. An overlapping region of the swaths may be identified by analysis of the indexed site values. The site values for all image sites are then stitched and the data is integrated and stored for later analysis.

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