US Patent 7763468 Specimen analysis method and specimen analysis device
Patent 7763468 was granted and assigned to ARKRAY on July, 2010 by the United States Patent and Trademark Office.
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Patent abstract
The present invention relates to a technique for analyzing a sample by utilizing a double integration circuit (11) for outputting a physical quantity related to the output from an analytical tool (2). In the present invention, the time interval from when the output from the analytical tool (2) is inputted into the double integration circuit (11) till when the physical quantity is started to be outputted from the double integration circuit (11) differs before and after the supply of the sample to the analytical tool (2) is confirmed.
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Patent Inventor Names
Takuji Kawai0
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US Patent 07763468 Specimen analysis method and specimen analysis device US Patent 7763468 Specimen analysis method and specimen analysis device
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Patent Number
077634680
Patent Number
77634680
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Current Assignee
Patent Jurisdiction
Patent Number
077634680
Date of Patent
July 27, 2010
0Patent Application Number
105775780
Date Filed
October 19, 2004
0Official Website
Patent Primary Examiner
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US Patent 07763468 Specimen analysis method and specimen analysis device
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07763468
Date of patent
July 27, 2010
Patent application number
10577578
Date Filed
October 19, 2004
Patent primary examiner
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