US Patent 7763468 Specimen analysis method and specimen analysis device

Patent 7763468 was granted and assigned to ARKRAY on July, 2010 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

ARKRAY

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

77634680

Patent Inventor Names

Takuji Kawai0

Date of Patent

July 27, 2010

Patent Application Number

105775780

Date Filed

October 19, 2004

Patent Primary Examiner

‌

Arlen Soderquist

Patent abstract

The present invention relates to a technique for analyzing a sample by utilizing a double integration circuit (11) for outputting a physical quantity related to the output from an analytical tool (2). In the present invention, the time interval from when the output from the analytical tool (2) is inputted into the double integration circuit (11) till when the physical quantity is started to be outputted from the double integration circuit (11) differs before and after the supply of the sample to the analytical tool (2) is confirmed.