US Patent 7628065 Method of measuring properties of interfacial adhesion
Patent 7628065 was granted and assigned to Hysitron, Inc. on December, 2009 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
December 22, 2005
0
Date of Patent
December 8, 2009
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Patent Application Number
11316456
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Patent Inventor Names
David J. Vodnick
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Thomas J. Wyrobek
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Richard J. Nay
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Dehua Yang
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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