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US Patent 7628065 Method of measuring properties of interfacial adhesion

Patent 7628065 was granted and assigned to Hysitron, Inc. on December, 2009 by the United States Patent and Trademark Office.

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Patent
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Patent attributes

Current Assignee
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Hysitron, Inc.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
76280650
Patent Inventor Names
David J. Vodnick0
Thomas J. Wyrobek0
Richard J. Nay0
Dehua Yang0
Date of Patent
December 8, 2009
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Patent Application Number
113164560
Date Filed
December 22, 2005
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Patent Primary Examiner
Hezron Williams
Hezron Williams
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Patent abstract

A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.

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