US Patent 7603891 Multiple frequency atomic force microscopy
Patent 7603891 was granted and assigned to Asylum Research Corporation on October, 2009 by the United States Patent and Trademark Office.
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Patent abstract
An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described.
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US Patent 07603891 Multiple frequency atomic force microscopy US Patent 7603891 Multiple frequency atomic force microscopy
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Patent Number
0760389100
Patent Number
760389100
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
076038910
Date of Patent
October 20, 2009
0Patent Application Number
115441300
Date Filed
October 5, 2006
0Official Website
Patent Primary Examiner
Edits on 23 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
076038910
Date of Patent
October 20, 2009
0Patent Application Number
115441300
Date Filed
October 5, 2006
0Official Website
Patent Primary Examiner
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US Patent 07603891 Multiple frequency atomic force microscopy
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07603891
Date of patent
October 20, 2009
Patent application number
11544130
Date Filed
October 5, 2006
Patent primary examiner
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