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US Patent 7519880 Burn-in using system-level test hardware

Patent 7519880 was granted and assigned to Advanced Micro Devices on April, 2009 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
Advanced Micro Devices
Advanced Micro Devices
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Date Filed
July 5, 2005
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Date of Patent
April 14, 2009
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Patent Application Number
11174823
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Patent Citations Received
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US Patent 11774492 Test system including active thermal interposer device
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US Patent 11835549 Thermal array with gimbal features and enhanced thermal performance
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US Patent 11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11656273 High current device testing apparatus and systems
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US Patent 11674999 Wafer scale active thermal interposer for device testing
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US Patent 11754620 DUT placement and handling for active thermal interposer device
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US Patent 11940487 Thermal solution for massively parallel testing
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 12066483 Method for testing an integrated circuit (IC) device at a testing temperature
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Patent Inventor Names
Glenn Eubank
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Chandrakant Pandya
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Jeff Brinkley
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John Heon Yi
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Michael Gregory Tarin
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Satwant Singh
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Steven Russell Klassen
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Trent William Johnson
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7519880
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Patent Primary Examiner
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Cynthia Britt
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