Patent 7510918 was granted and assigned to SAMSUNG ELECTRONICS CO., LTD. on March, 2009 by the United States Patent and Trademark Office.
In a transistor and a method of manufacturing the transistor, the transistor includes a dummy structure enclosing source/drain structures and channel structures. Thus, a gate electrode of the transistor may be efficiently formed over the channel structures. In addition, the source/drain structure may not grow exceedingly in an epitaxial growth process employed for forming the source/drain structure.