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US Patent 7440301 High frequency excitation system
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Patent
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Date Filed
December 13, 2006
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Date of Patent
October 21, 2008
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Patent Application Number
11610091
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Patent Citations Received
US Patent 12125673 Pulsed voltage source for plasma processing applications
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US Patent 11967483 Plasma excitation with ion energy control
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US Patent 11972924 Pulsed voltage source for plasma processing applications
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US Patent 12106938 Distortion current mitigation in a radio frequency plasma processing chamber
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US Patent 12111341 In-situ electric field detection method and apparatus
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US Patent 11776788 Pulsed voltage boost for substrate processing
US Patent 11776789 Plasma processing assembly using pulsed-voltage and radio-frequency power
US Patent 11791138 Automatic electrostatic chuck bias compensation during plasma processing
US Patent 11887813 Pulsed voltage source for plasma processing
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US Patent 11948780 Automatic electrostatic chuck bias compensation during plasma processing
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Patent Inventor Names
Thomas Kirchmeier
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Wolfgang R. Oestreicher
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
7440301
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Patent Primary Examiner
Matthew V. Nguyen
0
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