US Patent 7426419 Scheduling system and method
Patent 7426419 was granted and assigned to Texas Instruments on September, 2008 by the United States Patent and Trademark Office.
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Patent Inventor Names
James Heskin0
Julia Lafoy0
Mark Shepheard0
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Patent abstract
Photolithography operation in a wafer fab using relative weightings of work in progress to iteratively schedule wafers.
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US Patent 07426419 Scheduling system and method US Patent 7426419 Scheduling system and method
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Patent Number
07426419
Patent Number
7426419
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US Patent 07426419 Scheduling system and method
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Is a
Current assignee
Patent jurisdiction
Patent number
07426419
Date of patent
September 16, 2008
Patent application number
10640438
Date Filed
August 13, 2003
Patent primary examiner
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