US Patent 7418637 Methods and apparatus for testing integrated circuits
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Patent Inventor Names
Derick G. Behrends0
Peter T. Freiburger0
Ryan C. Kivimagi0
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Patent abstract
In some aspects a method is provided for testing an integrated circuit (IC). The method includes the steps of selecting a bit from each of a plurality of memory arrays formed on an IC chip, selecting one of the plurality of memory arrays, and storing the selected bit from the selected memory array. Numerous other aspects are provided.
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US Patent 07418637 Methods and apparatus for testing integrated circuits US Patent 7418637 Methods and apparatus for testing integrated circuits
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Patent Number
074186370
Patent Number
74186370
Edits on 21 May, 2023
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Patent Jurisdiction
Patent Number
074186370
Date of Patent
August 26, 2008
0Patent Application Number
106360600
Date Filed
August 7, 2003
0Official Website
Patent Primary Examiner
Edits on 14 Jun, 2022
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US Patent 07418637 Methods and apparatus for testing integrated circuits
Infobox
Is a
Patent jurisdiction
Patent number
07418637
Date of patent
August 26, 2008
Patent application number
10636060
Date Filed
August 7, 2003
Patent primary examiner
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