Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Ryan C. Kivimagi0
Derick G. Behrends0
Peter T. Freiburger0
Date of Patent
August 26, 2008
0Patent Application Number
106360600
Date Filed
August 7, 2003
0Patent Primary Examiner
Patent abstract
In some aspects a method is provided for testing an integrated circuit (IC). The method includes the steps of selecting a bit from each of a plurality of memory arrays formed on an IC chip, selecting one of the plurality of memory arrays, and storing the selected bit from the selected memory array. Numerous other aspects are provided.
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